Abstract: A method and apparatus are provided for measuring a thickness of a nonconductive coating disposed over portions of first and second conductive surfaces that intersect at an intersection angle. The apparatus is a thickness measurement gauge having an eddy current sensor. The thickness measurement gauge includes an eddy current sensor and electronic analyzer. The thickness gauge may be provided with a pressure enclosure. A method of calibrating a thickness measurement gauge and a calibration stand are also provided. The calibration stand has third and fourth conductive surfaces intersecting at the intersection angle. The conductivities of the third and fourth surfaces correspond to the conductivities of the first and second surfaces.

Abstract: Film thickness measurement systems and methods are provided that utilize a signal generator having a Gunnplexer design and a resonant frequency detector to correlate the shift in resonant frequency experienced by a resonant cavity having one face abutting a test object. The shift is resonant frequency is determinative of a linear or near linear correlation between film thickness and the resonant frequency shift.

Abstract: A method for measuring a thickness of a non-conductive coating on a semi-conductive substrate includes placing a pair of conducting plates in contact with the non-conductive coating. A capacitance value of the non-conductive coating in combination with the semi-conductive component is measured using a capacitance meter. The measured capacitance value of the non-conductive coating in combination with the semi-conductive component is then used to determine an independent capacitance value of the non-conductive coating. The thickness of the non-conductive coating is directly related to the independent capacitance value of the non-conductive coating.

Abstract: The present invention provides for systems, apparatuses and methods for use in determining if seals leak. The method includes sealing a seal, exposing the seal on a first side to a luminescent, generating a light, directing the light to impinge on a second side of the seal, and determining if the luminescent solution passed the seal to the second side of the seal. An alternative method provides for detecting if a seal on an aircraft is failing, including sealing the aircraft seal, exposing the seal to a luminescent, directing light at a second side of the seal, and determining if light is emitted from luminescent that passed the seal to the second side. An apparatus for detecting a failure of a seal can include a light source generating a light to impinge on the seal, and a detection filter that receives an emitted light and filters the emitted light.

Abstract: The present invention provides a method and apparatus for use in measuring a thickness of a layer and/or variations in layer thickness for layers that are flat, curved or have curves. The apparatus comprises a light source to generate a light beam, a light beam detector to detect at least a portion of the light beam reflected, an eddy current field generator that induces an eddy current, an eddy current detector to detect the induced eddy current and a processor coupled with the light source, light detector, eddy current field generator and eddy current detector, wherein the processor controls the light detector, eddy current field generator and eddy current detector. A radial characteristic of a region of the surface can be determined, a scaling factor can be determined based on the radial characteristic and a measured distance can be scaled based on the scaling factor in determining a thickness.