Abstract: Apparatuses, systems, and methods are disclosed for retiring storage regions. A determination module (a) determines that data stored in an Error Correcting Code (“ECC”) chunk contains ECC correctable errors, and (b) determines a bit error count for the ECC chunk. The ECC chunk is read from non-volatile solid-state storage media. A threshold module determines if the bit error count satisfies an ECC chunk error threshold. A storage region error module determines if a storage region that contains at least a portion of the ECC chunk satisfies region retirement criteria. The storage region may include a first portion on a first solid-state storage die and a second portion on a second solid-state storage die. A retirement module retires the storage region, including the first portion and the second portion in parallel, in response to the storage region containing at least a portion of the ECC chunk and satisfying the region retirement criteria.

Abstract: An apparatus, system, and method are disclosed for predicting failures in solid-state storage and include a determination module a threshold module, a storage region error module, and a retirement module. The determination module determines that data stored in an ECC chunk contains Error Correcting Code (“ECC”) correctable errors and further determines a bit error count for the ECC chunk. The ECC chunk originates from non-volatile solid-state storage media. The threshold module determines that the bit error count satisfies an ECC chunk error threshold. The storage region error module determines that a storage region that contained contains at least a portion of the ECC chunk satisfies a region retirement criteria. The retirement module retires the storage region that contains at least a portion of the ECC chunk where the storage region satisfies the region retirement criteria.