Abstract: A super-resolution scanning confocal polarization contrast microscope is provided. The microscope has a laser light source (1), sample stage (10) for mounting a sample 6 and detector (8). A polarization controller (3) is used to set the polarization state of the light beam to any one of a defined set of different polarization states. A spatial light modulator (5) modulates the light beam in amplitude and/or phase to focus a sub-diffraction-limit central spot on the sample together with unwanted sidebands. A scanning confocal scheme is used with a pin hole 9 in front of the detector (8) so that only that portion of the light is detected which has comes from the central spot, while rejecting light that has been scattered by the sample from the sidebands. Polarization contrast images with sub-diffraction limit resolution can thus be acquired.

Abstract: A super-resolution scanning confocal polarisation contrast microscope is provided. The microscope has a laser light source (1), sample stage (10) for mounting a sample 6 and detector (8). A polarisation controller (3) is used to set the polarisation state of the light beam to any one of a defined set of different polarisation states. A spatial light modulator (5) modulates the light beam in amplitude and/or phase to focus a sub-diffraction-limit central spot on the sample together with unwanted sidebands. A scanning confocal scheme is used with a pin hole 9 in front of the detector (8) so that only that portion of the light is detected which has comes from the central spot, while rejecting light that has been scattered by the sample from the sidebands. Polarisation contrast images with sub-diffraction limit resolution can thus be acquired.

Abstract: A super-oscillatory lens (10) having a pre-defined pattern to spatially modulate the light beam in amplitude and/or phase which has a blocking element (6) formed integrally with the lens, or as a separate component adjacent to the lens, which is opaque to the light beam to cause diffraction of the light beam around the blocking element and formation of a shadow region (20). The lens and blocking element focus the light beam to form an elongate needle-shaped focus (15) in the shadow region (20). In any application in which it is necessary to scan a small spot over a surface, compared with a conventional objective lens focus the elongate shape of the focus relaxes the requirement on a feedback loop to maintain a constant separation between a scan head and a surface being scanned. The elongate shape is also ideal shape for materials processing applications.

Abstract: An imaging apparatus is disclosed which uses a super-oscillatory lens to obtain sub-diffraction limit resolution. The super-oscillatory lens is arranged to receive a light beam from a light source, the lens having a pre-defined pattern to spatially modulate the light beam in amplitude and/or phase so that it focuses the light beam to a focus at a first focal point having a full width half maximum of less than half the wavelength. Collection optical elements are arranged to focus the first focal point to a second focal point conjugate to the first focal point. An object for imaging is scanned over the first focal point and a detector is arranged to collect light from a collection region centered on the second focal point.

Abstract: A super-oscillatory lens (10) having a pre-defined pattern to spatially modulate the light beam in amplitude and/or phase which has a blocking element (6) formed integrally with the lens, or as a separate component adjacent to the lens, which is opaque to the light beam to cause diffraction of the light beam around the blocking element and formation of a shadow region (20). The lens and blocking element focus the light beam to form an elongate needle-shaped focus (15) in the shadow region (20). In any application in which it is necessary to scan a small spot over a surface, compared with a conventional objective lens focus the elongate shape of the focus relaxes the requirement on a feedback loop to maintain a constant separation between a scan head and a surface being scanned. The elongate shape is also ideal shape for materials processing applications.

Abstract: An imaging apparatus is disclosed which uses a super-oscillatory lens to obtain sub-diffraction limit resolution. The super-oscillatory lens is arranged to receive a light beam from a light source, the lens having a pre-defined pattern to spatially modulate the light beam in amplitude and/or phase so that it focuses the light beam to a focus at a first focal point having a full width half maximum of less than half the wavelength. Collection optical elements are arranged to focus the first focal point to a second focal point conjugate to the first focal point. An object for imaging is scanned over the first focal point and a detector is arranged to collect light from a collection region centered on the second focal point.