Abstract: The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

Abstract: The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

Abstract: The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

Abstract: Generally, in accordance with the various illustrative embodiments disclosed herein, a current sensing probe includes a current-to-voltage conversion circuit that not only presents a desirable impedance into an inductive current sensing element of the current sensing probe, but also remains operationally stable over a wide range of frequencies when measuring a current flowing through a device-under-test. The wide frequency range can extend down to some low frequencies that can prove challenging to conventional current sensing probe circuits.

Abstract: The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

Abstract: A high-voltage active measurement probe is for a measurement instrument such as an oscilloscope. The high voltage active measurement probe includes an input terminal configured to receive an input signal from a device under test (DUT), a first output terminal configured to transmit a first output signal to the measurement instrument for measurement and display of peak voltages, and a second output terminal configured to transmit a second output signal to the measurement instrument for high sensitivity measurement and display of low level voltages. A first probe signal path is between the input terminal and the first output terminal, and a second probe signal path between the input terminal and the second output terminal. A first amplifier is in the first probe signal path between the input terminal and the first output terminal, and a second amplifier is in the second probe signal path between the input terminal and the second output terminal.

Abstract: An oscilloscope system includes a current probe, a processing unit and a display unit. The current probe includes a high and low gain signal paths for receiving simultaneously a signal of interest from a device under test (DUT), and to output amplified small and large current portions of the signal of interest, respectively. The processing unit receives first and second digitized data corresponding to the amplified small and large current portions output by the high and low gain signal paths, respectively, and processes the first and second digitized data for display as zoomed-in and zoomed-out waveform data, respectively. The display unit displays simultaneously a zoomed-in waveform in a first display window, based on the zoomed-in waveform data, and a zoomed-out waveform in a second display window, based on the zoomed-out waveform data, using the same time scale. The small current portion is less than a predetermined threshold.

Abstract: A probe for a measurement instrument comprises an input terminal configured to receive an input signal from a device under test (DUT), an output terminal configured to transmit an output signal to a measurement instrument, and a clamping circuit disposed in a signal path between the input terminal and the output terminal and configured to clamp an internal probe signal between an upper clamping threshold and a lower clamping threshold to produce the output signal, wherein the clamping circuit operates with substantial gain and amplitude linearity throughout a range between the upper clamping threshold and the lower clamping threshold.

Abstract: A high-voltage active measurement probe is for a measurement instrument such as an oscilloscope. The high voltage active measurement probe includes an input terminal configured to receive an input signal from a device under test (DUT), a first output terminal configured to transmit a first output signal to the measurement instrument for measurement and display of peak voltages, and a second output terminal configured to transmit a second output signal to the measurement instrument for high sensitivity measurement and display of low level voltages. A first probe signal path is between the input terminal and the first output terminal, and a second probe signal path between the input terminal and the second output terminal. A first amplifier is in the first probe signal path between the input terminal and the first output terminal, and a second amplifier is in the second probe signal path between the input terminal and the second output terminal.

Abstract: A measurement probe comprises at least one input port configured to receive an input signal generated in relation to a device under test (DUT), and an amplification unit configured to amplify the input signal with a first gain where the input signal has a first amplitude, and further configured to amplify the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude.

Abstract: An oscilloscope current probe system includes a probe amplifier unit, a probe head identifier, and first and second probe heads interchangeably connectable to the probe amplifier unit. Each probe head has a respective electrically-readable type identifier, a respective current input to receive a current to be measured, a respective internal sensing resistor in connected series with the current input, and a respective output at which a measurement voltage across the sensing resistor is output. The first and second probe heads differ in the resistance of their sensing resistors and the way their type identifiers read. The probe amplifier unit includes a differential amplifier to amplify the measurement voltage output by the probe head connected thereto. The probe head identifier is to read the type identifier of the probe head connected to the probe amplifier unit.

Abstract: A measurement probe comprises at least one input port configured to receive an input signal generated in relation to a device under test (DUT), and an amplification unit configured to amplify the input signal with a first gain where the input signal has a first amplitude, and further configured to amplify the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude.

Abstract: A probe for a measurement instrument comprises an input terminal configured to receive an input signal from a device under test (DUT), an output terminal configured to transmit an output signal to a measurement instrument, and a clamping circuit disposed in a signal path between the input terminal and the output terminal and configured to clamp an internal probe signal between an upper clamping threshold and a lower clamping threshold to produce the output signal, wherein the clamping circuit operates with substantial gain and amplitude linearity throughout a range between the upper clamping threshold and the lower clamping threshold.

Abstract: An oscilloscope system includes a current probe, a processing unit and a display unit. The current probe includes a high and low gain signal paths for receiving simultaneously a signal of interest from a device under test (DUT), and to output amplified small and large current portions of the signal of interest, respectively. The processing unit receives first and second digitized data corresponding to the amplified small and large current portions output by the high and low gain signal paths, respectively, and processes the first and second digitized data for display as zoomed-in and zoomed-out waveform data, respectively. The display unit displays simultaneously a zoomed-in waveform in a first display window, based on the zoomed-in waveform data, and a zoomed-out waveform in a second display window, based on the zoomed-out waveform data, using the same time scale. The small current portion is less than a predetermined threshold.

Abstract: An oscilloscope current probe system includes a probe amplifier unit, a probe head identifier, and first and second probe heads interchangeably connectable to the probe amplifier unit. Each probe head has a respective electrically-readable type identifier, a respective current input to receive a current to be measured, a respective internal sensing resistor in connected series with the current input, and a respective output at which a measurement voltage across the sensing resistor is output. The first and second probe heads differ in the resistance of their sensing resistors and the way their type identifiers read. The probe amplifier unit includes a differential amplifier to amplify the measurement voltage output by the probe head connected thereto. The probe head identifier is to read the type identifier of the probe head connected to the probe amplifier unit.