Patents by Inventor Ehud Pertzov

Ehud Pertzov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9589359
    Abstract: An apparatus, system, and method are described herein. The apparatus includes an emitter and a plurality of sensors. The emitter and the sensors are asymmetrically placed in the system with respect to the emitter. Data from the emitter and sensors is used to generate a high accuracy depth map and a dense depth map. A high resolution and dense depth map is calculated using the high accuracy depth map and the dense depth map.
    Type: Grant
    Filed: April 24, 2014
    Date of Patent: March 7, 2017
    Assignee: Intel Corporation
    Inventors: Ziv Aviv, David Stanhill, Dror Reif, Roi Ziss, Jeffrey Danowitz, Ehud Pertzov
  • Publication number: 20150310620
    Abstract: An apparatus, system, and method are described herein. The apparatus includes an emitter and a plurality of sensors. The emitter and the sensors are asymmetrically placed in the system with respect to the emitter. Data from the emitter and sensors is used to generate a high accuracy depth map and a dense depth map. A high resolution and dense depth map is calculated using the high accuracy depth map and the dense depth map.
    Type: Application
    Filed: April 24, 2014
    Publication date: October 29, 2015
    Applicant: Intel Corporation
    Inventors: ZIV AVIV, DAVID STANHILL, DROR REIF, ROI ZISS, JEFFREY DANOWITZ, EHUD PERTZOV
  • Patent number: 8077307
    Abstract: Apparatus for optical inspection includes an illumination assembly, including multiple parallel rows of light sources for emitting light and illumination optics associated with each row for directing the light onto an object under inspection. The multiple parallel rows include at least a first row with first illumination optics including a first array of prisms that are configured to reflect the light emitted by the light sources in the first row, and at least a second row with second illumination optics including a second array of prisms that are configured to refract the light emitted by the light sources in the second row. An imaging assembly is configured to capture an image of the object under illumination by the multiple parallel rows of the light sources.
    Type: Grant
    Filed: April 9, 2008
    Date of Patent: December 13, 2011
    Assignee: Orbotech Ltd.
    Inventors: Ehud Pertzov, Michael Matusovsky, Yaron Bar-Tal, Ilia Lutsker, Ofer Ish-Shalom
  • Publication number: 20090257050
    Abstract: Apparatus for optical inspection includes an illumination assembly, including multiple parallel rows of light sources for emitting light and illumination optics associated with each row for directing the light onto an object under inspection. The multiple parallel rows include at least a first row with first illumination optics including a first array of prisms that are configured to reflect the light emitted by the light sources in the first row, and at least a second row with second illumination optics including a second array of prisms that are configured to refract the light emitted by the light sources in the second row. An imaging assembly is configured to capture an image of the object under illumination by the multiple parallel rows of the light sources.
    Type: Application
    Filed: April 9, 2008
    Publication date: October 15, 2009
    Applicant: ORBOTECH LTD.
    Inventors: Ehud PERTZOV, Michael Matusovsky, Yaron Bar-Tal, Ilia Lutsker, Ofer Ish-Shalom