Patents by Inventor Eiji Fujine

Eiji Fujine has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7367000
    Abstract: The invention has an object to provide a method for simulating power voltage distribution of a semiconductor integrated circuit, by which it is possible to attempt to shorten the time required for preparing a power unit model and it is possible to carry out a highly accurate simulation with uneven distribution of a floor plan taken into account. In Step S1, design information (Core size CS, core ring width CW, block shape BS, macro shape MS, block current BI, macro current MI, etc.) is inputted into a simulator. In Step S2, information regarding a floor plan (Block position BP, macro position MP, power I/O position IOP) is inputted into the simulator by a designer. In Step S3, the power unit management table is initialized, and resistance modeling and current source modeling are also carried out. In Step S5 (FIG. 1), the static IR drop is calculated based on the power unit management table CT obtained in Step S4.
    Type: Grant
    Filed: December 19, 2005
    Date of Patent: April 29, 2008
    Assignee: Fujitsu Limited
    Inventors: Takashi Kurihara, Kenji Wada, Masahiro Suzuki, Eiji Fujine
  • Publication number: 20070044047
    Abstract: The invention has an object to provide a method for simulating power voltage distribution of a semiconductor integrated circuit, by which it is possible to attempt to shorten the time required for preparing a power unit model and it is possible to carry out a highly accurate simulation with uneven distribution of a floor plan taken into account. In Step S1, design information (Core size CS, core ring width CW, block shape BS, macro shape MS, block current BI, macro current MI, etc.) is inputted into a simulator. In Step S2, information regarding a floor plan (Block position BP, macro position MP, power I/O position IOP) is inputted into the simulator by a designer. In Step S3, the power unit management table is initialized, and resistance modeling and current source modeling are also carried out. In Step S5 (FIG. 1), the static IR drop is calculated based on the power unit management table CT obtained in Step S4.
    Type: Application
    Filed: December 19, 2005
    Publication date: February 22, 2007
    Applicant: Fujitsu Limited
    Inventors: Takashi Kurihara, Kenji Wada, Masahiro Suzuki, Eiji Fujine
  • Patent number: 6748572
    Abstract: Disclosed are a suitable power supply network analyzing method which executes power supply network analysis of a large-scale circuit in a short period of time with fewer computer hardware resources, a computer program which executes the power supply network analyzing method, a storage medium and a power supply network analyzing apparatus. An entire net list is extracted by converting circuit elements to current sources and dividing power supply lines into resistor elements, based on design information and physical information. Next, a portion of the power supply network which includes the current sources and in which the resistor elements are connected in series is selected. A partial net list is extracted to execute circuit compression by allocating the current sources to circuit elements in the selected portion. Then, the compressed net list is set in the entire net list to simplify the entire net list and power supply network analysis is performed.
    Type: Grant
    Filed: February 5, 2002
    Date of Patent: June 8, 2004
    Assignee: Fujitsu Limited
    Inventor: Eiji Fujine
  • Publication number: 20020199160
    Abstract: Disclosed are a suitable power supply network analyzing method which executes power supply network analysis of a large-scale circuit in a short period of time with fewer computer hardware resources, a computer program which executes the power supply network analyzing method, a storage medium and a power supply network analyzing apparatus. An entire net list is extracted by converting circuit elements to current sources and dividing power supply lines into resistor elements, based on design information and physical information. Next, a portion of the power supply network which includes the current sources and in which the resistor elements are connected in series is selected. A partial net list is extracted to execute circuit compression by allocating the current sources to circuit elements in the selected portion. Then, the compressed net list is set in the entire net list to simplify the entire net list and power supply network analysis is performed.
    Type: Application
    Filed: February 5, 2002
    Publication date: December 26, 2002
    Applicant: FUJITSU LIMITED
    Inventor: Eiji Fujine
  • Patent number: 6247162
    Abstract: A method and apparatus for generating external power wiring layout data for a semiconductor integrated circuit device determines an optimum layout without performing time consuming circuit simulation. An external power wiring supplies power to each of the functional blocks of the device. Design information is used to calculate a current consumption ratio for each power supply terminal of each functional block. Then, the current consumption for each power supply terminal is calculated using the calculated current consumption ratios. An external power wiring network is generated based on the calculated current consumption for each terminal. The generated external power wiring network is then analyzed and voltage and current values for each part of the network are calculated. Using the calculated voltage and current values, the wires are then optimally sized.
    Type: Grant
    Filed: December 29, 1998
    Date of Patent: June 12, 2001
    Assignee: Fujitsu Limited
    Inventors: Eiji Fujine, Takanori Nawa, Hiroshi Yuyama, Masahito Isoda
  • Patent number: 6035111
    Abstract: According to the present invention, using a computer aided design system for designing semiconductor integrated circuits wherein a plurality of logic cells forming a circuit net are disposed on a semiconductor chip according to a net list specifying a connection pattern assigned among input and output terminals of a plurality of logic cells and a wiring length connecting the terminals.
    Type: Grant
    Filed: November 13, 1996
    Date of Patent: March 7, 2000
    Assignees: Fujitsu Limited, Fujitsu VLSI Limited
    Inventors: Rieko Suzuki, Kiyoshi Saida, Kazushige Itazu, Eiji Fujine, Yoshihiro Kamiya, Yoshitaka Uchida, Takako Murakami, Teruhisa Tsuyuki, Kazunori Kawazoe, Takeshi Shimazaki, Yukimi Nishiwaki
  • Patent number: 5618744
    Abstract: According to the present invention, using a computer aided design system for designing semiconductor integrated circuits wherein a plurality of logic cells forming a circuit net are disposed on a semiconductor chip according to a net list specifying a connection pattern assigned among input and output terminals of a plurality of logic cells and a wiring length connecting the terminals.
    Type: Grant
    Filed: September 22, 1993
    Date of Patent: April 8, 1997
    Assignees: Fujitsu Ltd., Fujitsu VLSI Ltd.
    Inventors: Rieko Suzuki, Kiyoshi Saida, Kazushige Itazu, Eiji Fujine, Yoshihiro Kamiya, Yoshitaka Uchida, Takako Murakami, Teruhisa Tsuyuki, Kazunori Kawazoe, Takeshi Shimazaki, Yukimi Nishiwaki