Patents by Inventor Eiji Kanoh

Eiji Kanoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8374813
    Abstract: Provided is a sampling apparatus that samples a signal under measurement, including a sampling section that samples the signal under measurement with a plurality of sampling phases at non-uniform intervals for each sampling repetition cycle; and an inverting section that cancels out a replica that is not an observation target, from among the replicas in a sampling band of the signal under measurement and the replicas in the sampling band of a frequency component of the signal under measurement, by inverting signs of values of the signal under measurement sampled with at least one sampling phase from among the plurality of sampling phases.
    Type: Grant
    Filed: June 10, 2008
    Date of Patent: February 12, 2013
    Assignee: Advantest Corporation
    Inventors: Takayuki Akita, Eiji Kanoh, Masayuki Kawabata
  • Patent number: 8271222
    Abstract: Provided is a sampling apparatus that samples a signal under measurement, including a sample processing section that outputs sample data obtained by sampling the signal under measurement with a sampling timing at non-uniform intervals obtained by thinning a reference clock, a storage section that stores the sample data, and a waveform generating section that generates a waveform of the signal under measurement based on the sample data read from the storage section. The sample processing section includes a sampler that samples the signal under measurement in synchronization with the reference clock and a data thinning section that thins the sample data output by the sampler and outputs this thinned data as sample data with the sampling timing at non-uniform intervals.
    Type: Grant
    Filed: June 10, 2008
    Date of Patent: September 18, 2012
    Assignee: Advantest Corporation
    Inventors: Eiji Kanoh, Takayuki Akita, Masayuki Kawabata
  • Patent number: 8229706
    Abstract: Provided is a sampling apparatus that samples a signal under measurement, including a clock control section that generates a plurality of sampling clocks at a plurality of sampling phases at determined non-uniform intervals, so as to cancel out replicas in a sampling band that are not observation targets, from among the replicas of the signal under measurement and the replicas of the negative frequency component of the signal under measurement, in each sampling repetition cycle; and a sampling section that samples the signal under measurement with each of the plurality of sampling clocks.
    Type: Grant
    Filed: June 10, 2008
    Date of Patent: July 24, 2012
    Assignee: Advantest Corporation
    Inventors: Masayuki Kawabata, Takayuki Akita, Eiji Kanoh
  • Patent number: 8072206
    Abstract: Provided is a spectrum analysis system that measures a signal component at each frequency of an input signal, comprising a sampling section that samples the input signal at prescribed bandwidths to digitize the input signal, and outputs a resulting digital output signal; a converting section that converts the digital output signal from the sampling section into the signal component at each frequency of a unit bandwidth; and an output section that (i) outputs the digital output signal output by the sampling section when a frequency span, which is a frequency range in which the measurement result of the signal component at each frequency of the input signal is output, is greater than or equal to a predetermined reference bandwidth and (ii) outputs the signal component at each frequency converted by the converting section when the frequency span is less than the predetermined reference bandwidth.
    Type: Grant
    Filed: December 3, 2008
    Date of Patent: December 6, 2011
    Assignee: Advantest Corporation
    Inventors: Eiji Kanoh, Makoto Nakanishi, Tatsuru Orikasa, Tomoo Yamanouchi
  • Publication number: 20090306917
    Abstract: Provided is a sampling apparatus that samples a signal under measurement, including a sample processing section that outputs sample data obtained by sampling the signal under measurement with a sampling timing at non-uniform intervals obtained by thinning a reference clock, a storage section that stores the sample data, and a waveform generating section that generates a waveform of the signal under measurement based on the sample data read from the storage section. The sample processing section includes a sampler that samples the signal under measurement in synchronization with the reference clock and a data thinning section that thins the sample data output by the sampler and outputs this thinned data as sample data with the sampling timing at non-uniform intervals.
    Type: Application
    Filed: June 10, 2008
    Publication date: December 10, 2009
    Applicant: ADVANTEST CORPORATION
    Inventors: EIJI KANOH, TAKAYUKI AKITA, MASAYUKI KAWABATA
  • Publication number: 20090306919
    Abstract: Provided is a sampling apparatus that samples a signal under measurement, including a sampling section that samples the signal under measurement with a plurality of sampling phases at non-uniform intervals for each sampling repetition cycle; and an inverting section that cancels out a replica that is not an observation target, from among the replicas in a sampling band of the signal under measurement and the replicas in the sampling band of a frequency component of the signal under measurement, by inverting signs of values of the signal under measurement sampled with at least one sampling phase from among the plurality of sampling phases.
    Type: Application
    Filed: June 10, 2008
    Publication date: December 10, 2009
    Applicant: ADVANTEST CORPORATION
    Inventors: Takayuki Akita, Eiji Kanoh, Masayuki Kawabata
  • Publication number: 20090306936
    Abstract: Provided is a sampling apparatus that samples a signal under measurement, including a clock control section that generates a plurality of sampling clocks at a plurality of sampling phases at determined non-uniform intervals, so as to cancel out replicas in a sampling band that are not observation targets, from among the replicas of the signal under measurement and the replicas of the negative frequency component of the signal under measurement, in each sampling repetition cycle; and a sampling section that samples the signal under measurement with each of the plurality of sampling clocks.
    Type: Application
    Filed: June 10, 2008
    Publication date: December 10, 2009
    Applicant: ADVANTEST CORPORATION
    Inventors: Masayuki Kawabata, Takayuki Akita, Eiji Kanoh
  • Publication number: 20090302829
    Abstract: Provided is a spectrum analysis system that measures a signal component at each frequency of an input signal, comprising a sampling section that samples the input signal at prescribed bandwidths to digitize the input signal, and outputs a resulting digital output signal; a converting section that converts the digital output signal from the sampling section into the signal component at each frequency of a unit bandwidth; and an output section that (i) outputs the digital output signal output by the sampling section when a frequency span, which is a frequency range in which the measurement result of the signal component at each frequency of the input signal is output, is greater than or equal to a predetermined reference bandwidth and (ii) outputs the signal component at each frequency converted by the converting section when the frequency span is less than the predetermined reference bandwidth.
    Type: Application
    Filed: December 3, 2008
    Publication date: December 10, 2009
    Applicant: ADVANTEST CORPORATION
    Inventors: EIJI KANOH, MAKOTO NAKANISHI, TATSURU ORIKASA, TOMOO YAMANOUCHI
  • Publication number: 20080231254
    Abstract: A spectrum analyzer that measures a signal component for every frequency of an input signal includes a local signal generating section generating a local signal having a designated frequency, a multiplying section outputting a synthesized signal obtained by multiplying the local signal with the input signal, a band-pass filter through which a signal component having a prescribed frequency band of the synthesized signal is passed, an A-D conversion section outputting a digital output signal obtained by sampling and digitalizing the passed signal component, a spectrum generation section that passes a signal component within a measured frequency range of the input signal through the band-pass filter and generates a first frequency spectrum based on the digital output signal acquired from the signal component passed through the band-pass filter, and an elimination section generating a frequency spectrum free of noise based on the first frequency spectrum generated by the spectrum generation section.
    Type: Application
    Filed: September 29, 2007
    Publication date: September 25, 2008
    Applicant: ADVANTEST CORPORATION
    Inventors: Eiji Kanoh, Makoto Nakanishi
  • Patent number: 6535331
    Abstract: A wideband optical amplifier for amplifying an input optical signal of known wavelength in one of at least two bands of wavelength has a significantly small number of optical components and thus is low cost. The wideband optical amplifier includes: a first set of a first optical coupler, a first pump light source, and a first erbium doped optical fiber (EDF) which is excited by the first pump light source; an optical switch for changing an output signal of the first set; and a second set of a second optical coupler, a second pump light source, and a second EDF which is excited by the second pump light source. The first set amplifies a first band of optical signal while a series connection of the first set and the second set amplifies a second band of optical signal. In another aspect, a wideband variable wavelength optical source is achieved by utilizing the wideband optical amplifier described above within a closed loop.
    Type: Grant
    Filed: January 16, 2001
    Date of Patent: March 18, 2003
    Assignee: Advantest, Corp.
    Inventors: Kazunori Shiota, Eiji Kanoh
  • Publication number: 20010033411
    Abstract: A wideband optical amplifier for amplifying an input optical signal of known wavelength in one of at least two bands of wavelength has a significantly small number of optical components and thus is low cost. The wideband optical amplifier includes: a first set of a first optical coupler, a first pump light source, and a first erbium doped optical fiber (EDF) for pumping the first EDF; an optical switch for changing an output signal of the first set; and a second set of a second optical coupler, a second pump light source, and a second EDF for pumping the second EDF. In another aspect, a wideband variable wavelength optical source is achieved by utilizing the wideband optical amplifier described above.
    Type: Application
    Filed: January 16, 2001
    Publication date: October 25, 2001
    Inventors: Kazunori Shiota, Eiji Kanoh