Patents by Inventor Eiji Nishibori

Eiji Nishibori has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD OF OPTIMIZING MULTIPLE PARAMETERS BY HYBRID GA, METHOD OF DATA ANALYSYS BY PATTERN MATCHING, METHOD OF ESTIMATING STRUCTURE OF MATERIALS BASED ON RADIATION DIFFRACTION DATA, PROGRAMS, RECORDING MEDIUM, AND VARIOUS APPARATUS RELATED THERETO
    Publication number: 20090210366
    Abstract: The present invention provides a Hybrid GA (HGA) in which local optimization operation is performed to only a few individual with lower fitness selected from each population of widely distributed generations in genetic algorithm (GA). Since this HGA shows very powerful global searching ability even in a vast multi-dimensional parameter space with strong multi-peak feature, the present invention may efficiently determine a number of structural parameters from a little information included in X-ray diffraction circles. As a result, the present invention may determine a complicated material structure from powder specimen even though it is hard to make a single crystal specimen. Thus, the development of new materials would be highly accelerated in the field of medicines or materials, etc.
    Type: Application
    Filed: December 4, 2006
    Publication date: August 20, 2009
    Applicant: National University Corporation Nagoya University
    Inventors: Makoto Sakata, Eiji Nishibori
  • Method for measuring powder x-ray diffraction data using one-or-two-dimensional detector
    Patent number: 6813338
    Abstract: High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray detection units (pixels) in order to measure data for interpolation between pixels and the obtained interpolating data are put together to thereby improve the spatial resolution in measurement that has been limited by the detection unit in the detector.
    Type: Grant
    Filed: November 12, 2002
    Date of Patent: November 2, 2004
    Assignees: Japan Synchrotron Radiation Research Institute, Rigaku Corporation, Riken
    Inventors: Masaki Takata, Eiji Nishibori, Makoto Sakata, Jimpei Harada
  • Method for measuring powder x-ray diffraction data using one-or-two-dimensional detector
    Publication number: 20030091147
    Abstract: High-resolution powder diffraction is performed using high-energy synchrotron radiation as an x-ray source in such a way that a detector mounted on a measuring instrument such as a diffractometer is moved by smaller distances than the distance between adjacent x-ray detection units (pixels) in order to measure data for interpolation between pixels and the obtained interpolating data are put together to thereby improve the spatial resolution in measurement that has been limited by the detection unit in the detector.
    Type: Application
    Filed: November 12, 2002
    Publication date: May 15, 2003
    Applicant: Japan Synchrotron Radiation Research Institute
    Inventors: Masaki Takata, Eiji Nishibori, Makoto Sakata, Jimpei Harada