Patents by Inventor Eiji Tsujimura

Eiji Tsujimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240114913
    Abstract: There is provided an article inspection system including: an additional processing control unit that executes additional processing on an article determined to be defective among inspected articles, according to an inspection result of an article inspection unit, in which the additional processing control unit includes a quality state determination unit that determines which one of a plurality of preset quality states the inspection result corresponds to, and processing request selection means for selecting any one of first processing request information for requesting a working machine to perform first additional processing work by the working machine and second processing request information for requesting second manual additional processing work, according to a determination result of the quality state determination unit.
    Type: Application
    Filed: September 29, 2023
    Publication date: April 11, 2024
    Inventors: Eiji ASAI, Eiji TSUJIMURA, Toshiaki KIKUCHI
  • Patent number: 6862098
    Abstract: Apparatus for measuring displacement that measures the displacement (the irregularities) of the surface of a measuring object precisely and at high speed is provided. The apparatus for measuring displacement scans light radiated toward the surface of the measuring object and measures the amount of displacement of the surface of the measuring object without contact based upon the position of an image formation point formed on the light receiving plane of a light receiving element. Light receiving means is provided with a lens array composed of plural condenser lenses which converges measuring beams and an imaging lens for forming an image formation point on the light receiving plane by converged measuring beams. Reflected light from an irradiation point is converged by the lens array. The converged reflected light is imaged on the light receiving plane by the imaging lens.
    Type: Grant
    Filed: February 26, 1999
    Date of Patent: March 1, 2005
    Assignee: Anritsu Corporation
    Inventors: Atsuro Tanuma, Kouji Ohmori, Kazuki Nagatsuka, Eiji Tsujimura