Abstract: In accordance with the present invention, a method, system, computer system, and computer program product for considering clock skew in designing digital systems with latch-controlled circuits are provided. The disclosure teaches a method for determining whether logic operations can be performed within the available time and allows detailed modeling of clock skew for different domains of the integrated circuit. Taking clock skew into account for each domain, worst-case timing paths can be determined for circuits controlled by either flip-flops or latches. A design of an integrated circuit can be revised or verified using the method taught. The disclosure envisions that integrated circuits, printed circuit boards, computer systems and other components will be manufactured based upon designs developed with the method taught.

Abstract: In accordance with the present invention, a method, system, computer system, and computer program product for considering clock skew in designing digital systems with latch-controlled circuits are provided. The disclosure teaches a method for determining whether logic operations can be performed within the available time and allows detailed modeling of clock skew for different domains of the integrated circuit. Taking clock skew into account for each domain, worst-case timing paths can be determined for circuits controlled by either flip-flops or latches. A design of an integrated circuit can be revised or verified using the method taught. The disclosure envisions that integrated circuits, printed circuit boards, computer systems and other components will be manufactured based upon designs developed with the method taught.

Abstract: A method for extracting parasitic capacitance from an integrated circuit layout includes decomposing nets in the integrated circuit layout into conductive segments along two mutually perpendicular directions. The method further includes summing capacitances between the conductive segments in a selected net and the other conductive segments in the integrated circuit layout that are aligned with the conductive segments in the selected net and multiplying the sum by a first scaling factor to obtain a first capacitance value. The method further includes summing capacitances between the conductive segments in the selected net and the other conductive segments in the integrated circuit layout that are transverse to the conductive segments in the selected net to obtain a second capacitance value. The first capacitance value and the second capacitance value are added together to obtain a total capacitance value for the selected net.

Abstract: A technique measuring accuracy of parasitic capacitance extraction defines the error in an extracted total net parasitic capacitance intended for timing analysis as a sum of the errors in the extracted values of the individual capacitance elements, with the error for each element being influenced by a weight factor. Similarly, the technique defines an error in the extracted value of a crosstalk factor for the net of interest as a difference between the errors in the extracted values of the individual capacitance elements, with the error in each element being influenced by a weight factor. For signal timing and crosstalk analyses, the weight factors allow a designer to focus calibration of the extraction tool on the capacitive element having the highest weight factor.