Patents by Inventor Eiran Mandelker

Eiran Mandelker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240215938
    Abstract: In general, the present disclosure is directed to systems and methods for detecting features in x-ray images that are indicative of a condition. In one aspect a method of using a machine learning algorithm to analyze x-ray images to detect features indicative of conditions is disclosed. The method comprising receiving training x-ray images with paired higher detailed images, annotating the training x-ray images based on features identified in higher detailed images, training a machine learning model using the training x-ray images, receiving an x-ray image captured at an x-ray machine, and generating a diagnosis prediction by processing the x-ray image with the machine learning model to detect one or more features in the x-ray image indicative of one or more conditions.
    Type: Application
    Filed: December 28, 2023
    Publication date: July 4, 2024
    Inventor: Eiran Mandelker