Patents by Inventor Eisaku TERASHITA

Eisaku TERASHITA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11536673
    Abstract: In an analysis system in which a plurality of analysis apparatuses and a server are communicably connected, the plurality of analysis apparatuses each includes: an apparatus body that measures a sample; and an information processor that analyzes measurement data by the apparatus body. The information processor has a first storage unit for storing the measurement data and an analysis result of the measurement data, generates an analysis result summary based on the analysis result stored in the first storage unit, the analysis result summary indicating an outline of the analysis result, and transmits the analysis result summary to the server. The server has a second storage unit, and constructs a database in which analysis result summaries received from the information processor are accumulated, and stores the database into the second storage unit.
    Type: Grant
    Filed: November 27, 2019
    Date of Patent: December 27, 2022
    Assignee: Shimadzu Corporation
    Inventors: Eisaku Terashita, Keijiro Suzuki
  • Publication number: 20200174983
    Abstract: In an analysis system in which a plurality of analysis apparatuses and a server are communicably connected, the plurality of analysis apparatuses each includes: an apparatus body that measures a sample; and an information processor that analyzes measurement data by the apparatus body. The information processor has a first storage unit for storing the measurement data and an analysis result of the measurement data, generates an analysis result summary based on the analysis result stored in the first storage unit, the analysis result summary indicating an outline of the analysis result, and transmits the analysis result summary to the server. The server has a second storage unit, and constructs a database in which analysis result summaries received from the information processor are accumulated, and stores the database into the second storage unit.
    Type: Application
    Filed: November 27, 2019
    Publication date: June 4, 2020
    Inventors: Eisaku TERASHITA, Keijiro SUZUKI
  • Patent number: 9945796
    Abstract: An X-ray fluorescence analysis method in which the quantity of a contained component other than the principal component in the sample is determined by using the result of measurement of X-rays emitted from a sample whose principal component is an organic component, includes: setting a quantitative value of the contained component; calculating an area occupancy ratio representing the proportion of X-rays falling onto the sample; recalculating the area occupancy ratio based on a comparison of a measured value of the scattered X-ray intensity with a theoretical value of the scattered X-ray intensity calculated using a recalculated quantitative value of the contained component and the area occupancy ratio; repeating the recalculation of the quantitative value of the contained component and the recalculation of the area occupancy ratio, and determining the quantitative value as the definite quantitative value of the contained component when the quantitative value satisfies a previously set convergence condition.
    Type: Grant
    Filed: October 15, 2013
    Date of Patent: April 17, 2018
    Assignee: SHIMADZU CORPORATION
    Inventor: Eisaku Terashita
  • Publication number: 20160258887
    Abstract: Provided is an X-ray fluorescence analysis method in which the quantity of a contained component other than the principal component in the sample is determined by using the result of a measurement of X-rays emitted from a sample whose principal component is an organic component, the method including the steps of: setting a quantitative value of the contained component based on a measured value of a fluorescent X-ray intensity; calculating an area occupancy ratio which represents the proportion of the X-rays falling onto the sample, based on a measured value of a scattered X-ray intensity and a theoretical value of the scattered X-ray intensity calculated on the assumption that the sample is composed of the principal component and that the entire amount of the cast X-rays fall onto the sample; recalculating the quantitative value of the contained component based on the measured value of the fluorescent X-ray intensity and a theoretical value of the fluorescent X-ray intensity calculated using the quantitative
    Type: Application
    Filed: October 15, 2013
    Publication date: September 8, 2016
    Applicant: SHIMADZU CORPORATION
    Inventor: Eisaku TERASHITA