Patents by Inventor Eisuke Kanazawa

Eisuke Kanazawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Defect detecting method and defect detecting device
    Patent number: 7978903
    Abstract: A defect detecting method includes: an image acquiring process for capturing an image of an inspection object having an identical sequence of pattern and acquiring the image; and a defect emphasizing process for emphasizing a defect of the captured image. The defect emphasizing process includes: an inspected-point selecting process for sequentially selecting an inspection point on the captured image; and a defect emphasizing value calculating process for obtaining differences by subtracting from a luminance value of the selected inspection point each luminance value of a plurality of comparison points disposed around the inspection point and selecting one difference of the smallest value of the obtained differences in luminance to determine a defect emphasizing value of the inspection point.
    Type: Grant
    Filed: August 25, 2006
    Date of Patent: July 12, 2011
    Assignee: Seiko Epson Corporation
    Inventors: Koichi Kojima, Eisuke Kanazawa
  • Defect detecting method and defect detecting device
    Publication number: 20070047801
    Abstract: A defect detecting method includes: an image acquiring process for capturing an image of an inspection object having an identical sequence of pattern and acquiring the image; and a defect emphasizing process for emphasizing a defect of the captured image. The defect emphasizing process includes: an inspected-point selecting process for sequentially selecting an inspection point on the captured image; and a defect emphasizing value calculating process for obtaining differences by subtracting from a luminance value of the selected inspection point each luminance value of a plurality of comparison points disposed around the inspection point and selecting one difference of the smallest value of the obtained differences in luminance to determine a defect emphasizing value of the inspection point.
    Type: Application
    Filed: August 25, 2006
    Publication date: March 1, 2007
    Inventors: Koichi Kojima, Eisuke Kanazawa