Abstract: There is provided an aging diagnostic device including: a reference ring oscillator (101) that constitutes a ring oscillator using an odd-numbered plurality of logic gates constituted using a CMOS circuit; a test ring oscillator (102) that constitutes a ring oscillator using an odd-numbered plurality of logic gates having the same configuration as that of the logic gate; a load unit (104) that inputs a load signal to the test ring oscillator (102); a control unit (105) that simultaneously inputs a control signal instructing a start of oscillation of the reference ring oscillator (101) and the test ring oscillator (102) to the reference ring oscillator (101) and the test ring oscillator (102); and a comparison unit (103) that compares differences in the amount of movement of pulses within the reference ring oscillator (101) and the test ring oscillator (102), respectively, in the same time.

Abstract: Current reading means detects an output current of a current source whose output current varies with a variation in temperature and outputs a value proportional to the output current. The temperature of the current source corresponding to the output value of the current reading means which is proportional to the output current of the current source is measured, and a parameter for converting the output value to temperature information is determined from the output value of the current reading means and the measured value of the temperature of the current source corresponding to the output value. The output value of the current reading means is converted to the temperature information using the determined parameter.

Abstract: The mode-locking frequencies of two femtosecond laser light sources are controlled so that they are stabilized at high degree and the difference between the mode-locking frequencies is constant. The output of the laser light sources are used as a pumping light for generating terahertz pulses and a probe pulse light for terahertz detection. Since the time delay timings of the terahertz pulses and the probe pulse light the pulse periods of which are slightly different from each other shift from each other and the difference increases. Therefore, the temporally expanded terahertz pulses are measured by high-speed sampling without using any mechanical stage for time delay scanning. The terahertz electric field time waveform measured by high-speed sampling with the measurement time window of the pulse period is subjected to time-scale conversion and Fourier transform.

Abstract: A high-resolution high-speed terahertz spectrometry for measuring a terahertz frequency spectrum at high speed with a laser mode-locking frequency which is the theoretical limitation frequency resolution of the terahertz time-domain spectroscopy. The mode-locking frequencies of two femtosecond laser light sources are controlled so that they are stabilized at high degree and the difference between the mode-locking frequencies is constant. The output of the laser light sources are used as a pumping light for generating terahertz pulses and a probe pulse light for terahertz detection. Since the time delay timings of the terahertz pulses and the probe pulse light the pulse periods of which are slightly different from each other shift from each other and the difference increases. Therefore, the temporally expanded terahertz pulses are measured by high-speed sampling without using any mechanical stage for time delay scanning.