Patents by Inventor Eitam Yitzchak Vinegrad

Eitam Yitzchak Vinegrad has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11835769
    Abstract: An adjustable attenuation optical unit that may include a lightguide that includes a core, wherein the core comprises an output, an input and an exterior surface; and an adjustable attenuator that is configured to define an interfacing parameter related to an area of the exterior surface thereby receiving at least some of the light that impinges on the area.
    Type: Grant
    Filed: August 17, 2021
    Date of Patent: December 5, 2023
    Assignee: Applied Materials Israel Ltd.
    Inventors: Eitam Yitzchak Vinegrad, Itay Asulin
  • Patent number: 11646173
    Abstract: A scanning electron microscope and a method for evaluating a sample, the method may include (a) illuminating the sample with a primary electron beam, (b) directing secondary electrons emitted from the sample and propagated above a first scintillator, towards an upper portion of the first scintillator, wherein the first scintillator and a second scintillator are positioned between the sample and a column electrode of the column; wherein the first scintillator is positioned above the second scintillator; (c) detecting the secondary electrons by the first scintillator; (d) directing backscattered electrons emitted from the sample towards a lower portion of the second scintillator; and (e) detecting the backscattered electrons by the second scintillator.
    Type: Grant
    Filed: July 7, 2021
    Date of Patent: May 9, 2023
    Assignee: Applied Materials Israel Ltd.
    Inventors: Itay Asulin, Emil Weisz, Eitam Yitzchak Vinegrad, Menachem Lapid, Boris Rozensvaig
  • Publication number: 20230055035
    Abstract: An adjustable attenuation optical unit that may include a lightguide that includes a core, wherein the core comprises an output, an input and an exterior surface; and an adjustable attenuator that is configured to define an interfacing parameter related to an area of the exterior surface thereby receiving at least some of the light that impinges on the area.
    Type: Application
    Filed: August 17, 2021
    Publication date: February 23, 2023
    Applicant: Applied Materials Israel Ltd.
    Inventors: Eitam Yitzchak Vinegrad, Itay Asulin
  • Publication number: 20210335569
    Abstract: A scanning electron microscope and a method for evaluating a sample, the method may include (a) illuminating the sample with a primary electron beam, (b) directing secondary electrons emitted from the sample and propagated above a first scintillator, towards an upper portion of the first scintillator, wherein the first scintillator and a second scintillator are positioned between the sample and a column electrode of the column; wherein the first scintillator is positioned above the second scintillator; (c) detecting the secondary electrons by the first scintillator; (d) directing backscattered electrons emitted from the sample towards a lower portion of the second scintillator; and (e) detecting the backscattered electrons by the second scintillator.
    Type: Application
    Filed: July 7, 2021
    Publication date: October 28, 2021
    Inventors: Itay Asulin, Emil Weisz, Eitam Yitzchak Vinegrad, Menachem Lapid, Boris Rozensvaig