Abstract: The invention relates to an apparatus for testing electronic components, in particular IC's, having a transporting device to which holders for the components are detachably attached by fastening devices, and which is passed through a loading station to receive the components, a testing station to test the components and an unloading station to remove the components. To generally improve the functional efficiency of the apparatus and to carry out in particular the loading and unloading procedure with less danger of damaging the components, it is proposed according to the invention to provide that the holder, together with the components, can be attached to the transporting device in the loading station and be removed therefrom in the unloading station.

Abstract: An apparatus for separating objects of the same kind, in particular electronic components such as integrated circuits (IC's), that are delivered in succession in a sloping delivery passage, the apparatus having a stop member arranged in the region of the delivery passage that is displaced substantially transverse to the direction of delivery so that it holds back or holds fast the respective foremost object, and having a control circuit (P) that cyclically controls the displacing movement of the stop member, is to be designed so that while ensuring a relatively long service life it is suitable for use for different components, in particular with regard to their length.

Abstract: An apparatus for testing and sorting electronic components (33), in particular IC's, is directly mounted on the mounting (2a, 2b to 10a, 10b), preferably forming part of a manipulator, for a test computer. In order to convey the components (33) between an input magazine (16), a testing head (20) and an output magazine (17) a suction head (20) is provided which is movable on a carriage guide (15) and which may be lowered. The mounting forming part of the manipulator permits the test computer (1) and the whole apparatus arranged on a slope so that the components (33) in the magazine rods (26) of the input magazine (16) and the output magazine (17) slide forwards under gravity.

Abstract: In a device for testing and sorting electronic components, and more particularly integrated circuit chips, the untested components are arranged in parallel magazine channels, which are arranged on a gradient, of an input magazine. The tested components are collected in an output magazine set up in the same way. The magazines are to be suitable, more particularly, for taking up CC (chip carrier) components. These components have a free rear surface upon which they can slip in the magazine channels arranged on a gradient. The magazines consist of a flat base plate (15), upon which guide rails, which are T-shaped in cross section, are mounted in such a way that they limit the magazine channels at the side and at the top, the guide rails being connected with each other to form a block which, as a whole, is capable of being exchanged. The components are tested in a channel, their connecting contacts being connected up with corresponding test contacts.

Abstract: To reduce manual work by an operator filling and unloading a device for testing and sorting electronic components it is suggested that a cassette carriage carrier (8) with a cassette carriage (10) displaceable therein, be placed in front of the input magazine (2). The cassette carriage (10) carries a cassette (11), on which a large number of magazine rods (12) are arranged side by side. The magazine rods (12) are displaceable and arranged on a plane which extends perpendicularly to the plane of the magazine channels of the input magazine (2) of the device (1). In the same way there can be provision for a cassette carriage carrier (8a) with a cassette (10a) and a cassette (11a) as well as the magazine rods (12a) attached to it in connection with the output magazine (6) of the device (1).

Abstract: In the case of an apparatus for testing and sorting oblong, electronic components, more particularly integrated chips, the components, which have been supplied in a row, are separated by means of a separating arrangement. The separating arrangement consists of a belt conveyer, which is arranged above a slideway for the components which have been supplied and which takes hold of the components which have been supplied and pushes them forward on the slideway. A control signal, which is emitted by a detecting arrangement which is arranged after the separating arrangement, is used for the purpose of stopping the belt conveyer so that the component, which has just been delivered by the belt conveyer, can, in the first instance, be tested. After testing has taken place, the belt conveyer is set in operation again.

Abstract: In a device for conveying components contained in an input magazine, particularly integrated chips, to an output magazine (3), which is connected to the input magazine by means of a testing device, individual component receiving portions (34) of the output magazine (3) are provided with storage and indicating devices (52), each of which store and indicate information corresponding to a component testing and measuring class. The components are supplied to the receiving portions (34) of the output magazine (3), on the basis of the data stored in the individual storage and indicating devices (52), so that a component determined by the testing device as belonging to a certain component test and measuring class is conveyed to the receiving portions (34) associated with this class, and in the absence of such a receiving portion is conveyed to a receiving portion which is still free, which is then marked as belonging to the test and measuring class in question.