Patents by Inventor Eli Buchman

Eli Buchman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Guided inspection of a semiconductor wafer based on systematic defects
    Patent number: 10605745
    Abstract: A candidate defect may be identified at a semiconductor wafer. A determination may be made as to whether the candidate defect at the semiconductor wafer corresponds to a systematic defect or a random defect. In response to determining that the candidate defect at the semiconductor wafer corresponds to a systematic detect, the candidate defect at the semiconductor wafer may be provided to a defect review tool for review by the defect review tool.
    Type: Grant
    Filed: June 28, 2018
    Date of Patent: March 31, 2020
    Assignee: APPLIED MATERIALS ISRAEL LTD.
    Inventors: Yotam Sofer, Boaz Cohen, Saar Shabtay, Eli Buchman
  • GUIDED INSPECTION OF A SEMICONDUCTOR WAFER BASED ON SYSTEMATIC DEFECTS
    Publication number: 20200003700
    Abstract: A candidate defect may be identified at a semiconductor wafer. A determination may be made as to whether the candidate defect at the semiconductor wafer corresponds to a systematic defect or a random defect. In response to determining that the candidate defect at the semiconductor wafer corresponds to a systematic detect, the candidate defect at the semiconductor wafer may be provided to a defect review tool for review by the defect review tool.
    Type: Application
    Filed: June 28, 2018
    Publication date: January 2, 2020
    Inventors: Yotam Sofer, Boaz Cohen, Saar Shabtay, Eli Buchman