Patents by Inventor Elias Edmond Shihadeh

Elias Edmond Shihadeh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for measuring thickness of a layer in a multi-layered object
    Patent number: 6494097
    Abstract: A method and device for determining a thickness of a layer in an object. For each of a plurality of frequencies, a continuous vibrational wave is generated at a surface of the layer and an energy of a steady state echo wave produced in the object in response to the generated vibrational wave is measured. The thickness of the layer is then calculated based upon the measured energies of the steady state echoes.
    Type: Grant
    Filed: September 5, 2000
    Date of Patent: December 17, 2002
    Inventor: Elias Edmond Shihadeh