Abstract: The invention relates to a device for identifying a material of an object having a source of X-Ray photons and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after scattering in a volume (?V) of the material and an energy of the X-Ray photons of the backscattered beam. The incident and backscattered beams forming a scattering angle (?). An adjusting device adjusts the position between the source, the detector and the object in order for the volume to be at different depths with a constant angle. A processing device processes the two magnitudes in two positions and the energy in one position and calculates an attenuation coefficient (?material (E0, E1, ?)). An estimating device estimates the density (?) of the material.

Abstract: A device for identifying a material of an object including: a source of X photons, and a spectrometric detector, the source irradiating the object with an incident beam and the detector measuring a magnitude of a backscattered beam from the incident beam after scattering in a volume of the material and an energy of the X photons of the backscattered beam, the incident and backscattered beams forming a scattering angle. Further, a mechanism adjusts position between the source, the detector, and the object for volume to be at different depths with a constant angle, and a mechanism processes the two magnitudes in two positions and the energy in one position to calculate an attenuation coefficient for estimating the density of the material.