Patents by Inventor Ellen YOUNG

Ellen YOUNG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230018080
    Abstract: The present invention provides compositions and methods of use comprising a chimeric dengue virus E glycoprotein comprising a dengue virus E glycoprotein backbone, which comprises amino acid substitutions that may introduce an epitope that is recognized by an antibody from a dengue virus serotype that is different from the dengue virus serotype of the dengue virus E glycoprotein backbone.
    Type: Application
    Filed: November 20, 2020
    Publication date: January 19, 2023
    Inventors: Ralph Baric, Ellen Young, Jennifer Munt
  • Patent number: 11241491
    Abstract: The present invention provides compositions and methods of use comprising a chimeric dengue virus E glycoprotein comprising a dengue virus E glycoprotein backbone, which comprises amino acid substitutions that introduce a dengue virus E glycoprotein epitope from a dengue virus serotype that is different from the dengue virus serotype of the dengue virus E glycoprotein backbone.
    Type: Grant
    Filed: May 23, 2018
    Date of Patent: February 8, 2022
    Assignee: The University of North Carolina at Chapel Hill
    Inventors: Ralph Baric, Matthew Begley, Douglas Widman, Aravinda Desilva, Usha Nivarthi, Boyd Yount, Ellen Young
  • Publication number: 20200155663
    Abstract: The present invention provides compositions and methods of use comprising a chimeric dengue virus E glycoprotein comprising a dengue virus E glycoprotein backbone, which comprises amino acid substitutions that introduce a dengue virus E glycoprotein epitope from a dengue virus serotype that is different from the dengue virus serotype of the dengue virus E glycoprotein backbone.
    Type: Application
    Filed: May 23, 2018
    Publication date: May 21, 2020
    Inventors: Ralph BARIC, Matthew BEGLEY, Douglas WIDMAN, Aravinda DESILVA, Usha NIVARTHI, Boyd YOUNT, Ellen YOUNG
  • Patent number: 9449788
    Abstract: One embodiment relates to an electron beam apparatus for inspection and/or review. An electron source generates a primary electron beam, and an electron-optics system shapes and focuses said primary electron beam onto a sample held by a stage. A detection system detects signal-carrying electrons including secondary electrons and back-scattered electrons from said sample, and an image processing system processes data from said detection system. A host computer system that controls and coordinates operations of the electron-optics system, the detection system, and the image processing system. A graphical user interface shows a parameter space and provides for user selection and activation of operating parameters of the apparatus. Another embodiment relates to a method for detecting and/or reviewing defects using an electron beam apparatus. Other embodiments, aspects and features are also disclosed.
    Type: Grant
    Filed: June 10, 2014
    Date of Patent: September 20, 2016
    Assignee: KLA-Tencor Corporation
    Inventors: Gary G. Fan, Kumar Raja Guvindan Raju, Wade Lenn Jensen, Hong Xiao, Lorraine Ellen Young
  • Publication number: 20150090877
    Abstract: One embodiment relates to an electron beam apparatus for inspection and/or review. An electron source generates a primary electron beam, and an electron-optics system shapes and focuses said primary electron beam onto a sample held by a stage. A detection system detects signal-carrying electrons including secondary electrons and back-scattered electrons from said sample, and an image processing system processes data from said detection system. A host computer system that controls and coordinates operations of the electron-optics system, the detection system, and the image processing system. A graphical user interface shows a parameter space and provides for user selection and activation of operating parameters of the apparatus. Another embodiment relates to a method for detecting and/or reviewing defects using an electron beam apparatus. Other embodiments, aspects and features are also disclosed.
    Type: Application
    Filed: June 10, 2014
    Publication date: April 2, 2015
    Applicant: KLA-TENCOR CORPORATION
    Inventors: Gary G. FAN, Kumar Raja GUVINDAN RAJU, Wade Lenn JENSEN, Hong XIAO, Lorraine Ellen YOUNG
  • Publication number: 20140280254
    Abstract: A data acquisition system can receive a plurality of files from a plurality of sources and can automate selection of a suitable application for accessing each file and determination of a suitable pattern template for recognizing and extracting data from a respective file. The data acquisition system can store the extracted data in a customized data structure that can be specified for each source and/or each type of data. The data acquisition system further can provide one or more user interfaces that can enable a user to upload, create or define a pattern template for a file and/or document.
    Type: Application
    Filed: March 15, 2013
    Publication date: September 18, 2014
    Applicant: FEICHTNER DATA GROUP, INC.
    Inventors: Mark Eugene Feichtner, Windy Ellen Young, Brian Joseph Zier, Matthew Jeffery Laukala, Gerry Dean Crooks, Robert Earl Moss
  • Patent number: 5863166
    Abstract: A device for locking bicycle components to the bicycle frame comprises a threaded bolt with a corresponding nut having a rotatable casing surrounding the outer surface thereof and a key for engaging the nut. The key and the end face of the nut have at least one spigot and at least one hole such that the spigots of each fit into the holes of the other. When so engaged, the key is capable of turning the nut. The key preferably includes leverage arms for aiding the turning of the nut.
    Type: Grant
    Filed: August 5, 1997
    Date of Patent: January 26, 1999
    Assignee: Pinhead Components Inc.
    Inventor: Linda Ellen Young