Patents by Inventor Ellis Yuan

Ellis Yuan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for configuration of automated debug of in-circuit tests
    Patent number: 7089139
    Abstract: A method for configuring an automated in-circuit test debugger is presented. The novel test debug and optimization configuration technique configures expert knowledge into a knowledge framework for use by an automated test debug and optimization system for automating the formulation of a valid stable in-circuit test for execution on an integrated circuit tester. In a system that includes a rule-based controller for controlling interaction between the test-head controller of an integrated circuit tester and an automated debug system, the invention includes a knowledge framework and a rule-based editor. The knowledge framework stores test knowledge in the representation of rules that represent a debugging strategy. The rule-based editor facilitates the use of rules as knowledge to debug or optimize an in-circuit test that is to be executed on the integrated circuit tester.
    Type: Grant
    Filed: August 16, 2004
    Date of Patent: August 8, 2006
    Assignee: Agilent Technologies, Inc.
    Inventors: Aik Koon Loh, Keen Fung Wai, Tiam Hock Tan, Roy H. Williams, Daniel Z. Whang, Chen Ni Low, Ellis Yuan
  • Method and apparatus for configuration of automated debug of in-circuit tests
    Publication number: 20060036390
    Abstract: A method for configuring an automated in-circuit test debugger is presented. The novel test debug and optimization configuration technique configures expert knowledge into a knowledge framework for use by an automated test debug and optimization system for automating the formulation of a valid stable in-circuit test for execution on an integrated circuit tester. In a system that includes a rule-based controller for controlling interaction between the test-head controller of an integrated circuit tester and an automated debug system, the invention includes a knowledge framework and a rule-based editor. The knowledge framework stores test knowledge in the representation of rules that represent a debugging strategy. The rule-based editor facilitates the use of rules as knowledge to debug or optimize an in-circuit test that is to be executed on the integrated circuit tester.
    Type: Application
    Filed: August 16, 2004
    Publication date: February 16, 2006
    Inventors: Aik Loh, Keen Wai, Tiam Tan, Roy Williams, Daniel Whang, Chen Low, Ellis Yuan