Patents by Inventor Elmar J. Mayer

Elmar J. Mayer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7214928
    Abstract: A scanning unit for an optical position measuring device, the scanning unit having a structured optoelectronic photodetector that includes: a semiconductor substrate, a plurality of radiation-sensitive detector areas, which are arranged next to each other on the semiconductor substrate and a strip conductor, wherein at least a portion of the strip conductor is positioned across a surface defined by the plurality of detector areas and forms a connection with an associated detector area of the plurality of detector areas.
    Type: Grant
    Filed: April 27, 2001
    Date of Patent: May 8, 2007
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Elmar J. Mayer, Wolfgang Holzapfel, Klaus Loeschcke
  • Patent number: 6965437
    Abstract: A scanning unit for an optical position measuring device for scanning a periodic strip pattern in a detector plane, the scanning unit including a detector arrangement including a first detector array with a first set of several radiation-sensitive detector elements, which are arranged next to each other in a first direction on a common support substrate and a second detector array including a second set of several radiation-sensitive detector elements arranged adjacent to the first detector array in a second direction perpendicular with respect to the first direction a detection plane. The second set of several radiation-sensitive detector elements are arranged next to each other in the first direction with a common period PDET, and have a geometrically defined offset (?x1i) in the first direction with respect to the first set of several radiation-sensitive detector elements.
    Type: Grant
    Filed: April 14, 2001
    Date of Patent: November 15, 2005
    Assignee: Dr. Johannes Heidenhain GmbH
    Inventors: Elmar J. Mayer, Wolfgang Holzapfel
  • Publication number: 20040119989
    Abstract: A scanning unit for an optical position measuring device, the scanning unit having a structured optoelectronic photodetector that includes: a semiconductor substrate, a plurality of radiation-sensitive detector areas, which are arranged next to each other on the semiconductor substrate and a strip conductor, wherein at least a portion of the strip conductor is positioned across a surface defined by the plurality of detector areas and forms a connection with an associated detector area of the plurality of detector areas.
    Type: Application
    Filed: November 28, 2003
    Publication date: June 24, 2004
    Inventors: Elmar J Mayer, Wolfgang Holzapfel, Klaus Loeschcke
  • Publication number: 20040046113
    Abstract: Disclosed is a scanning unit for an optical position measuring device. The inventive device is suitable for scanning a periodic striped pattern within a detection plane and is highly insensitive with respect to short periodic disruptions of the scanned measurement partition. The scanning unit consists of at least one detector array provided with several radiation-sensitive detector elements which are disposed adjacent to each other in a first direction on a common carrier substrate with a period PDET. At least one second detector array consisting of several radiation-sensitive detector elements is arranged in an adjacent position to the first detector array in a direction which is perpendicular to the first direction on the plane of detection. The detector elements of the second detector array are also disposed adjacent to each other in the first direction.
    Type: Application
    Filed: March 17, 2003
    Publication date: March 11, 2004
    Inventors: Elmar J. Mayer, Wolfgang Holzapfel