Abstract: An optical measurement method and system. The system includes, and method applies, a light source, a beamsplitter, at least one filter, a output photodetector for acquiring data of a sample, and a correction photodetector for correcting and maintaining output intensity from the light source. The filter is located between the light source and the correction photodetector for normalizing the spectrum of the input light being applied to input light correction. The filter may be incorporated into the beamsplitter and may be tuned to filter light from the light source for providing non-zero transmission of light with a near-zero gradient for wavelengths in a portion of the spectrum of the input light being applied to the sample and read by the output photodetector. The filter may also or alternatively be located downstream of the beamsplitter to correct for wavelength sensitivity of the correction photodetector.

Abstract: An optical measurement method and system. The system includes, and method applies, a light source, a beamsplitter, at least one filter, a output photodetector for acquiring data of a sample, and a correction photodetector for correcting and maintaining output intensity from the light source. The filter is located between the light source and the correction photodetector for normalizing the spectrum of the input light being applied to input light correction. The filter may be incorporated into the beamsplitter and may be tuned to filter light from the light source for providing non-zero transmission of light with a near-zero gradient for wavelengths in a portion of the spectrum of the input light being applied to the sample and read by the output photodetector. The filter may also or alternatively be located downstream of the beamsplitter to correct for wavelength sensitivity of the correction photodetector.

Abstract: An optical measurement method and system. The system includes, and method applies, a light source, a beamsplitter, at least one filter, a output photodetector for acquiring data of a sample, and a correction photodetector for correcting and maintaining output intensity from the light source. The filter is located between the light source and the correction photodetector for normalizing the spectrum of the input light being applied to input light correction. The filter may be incorporated into the beamsplitter and may be tuned to filter light from the light source for providing non-zero transmission of light with a near-zero gradient for wavelengths in a portion of the spectrum of the input light being applied to the sample and read by the output photodetector. The filter may also or alternatively be located downstream of the beamsplitter to correct for wavelength sensitivity of the correction photodetector.

Abstract: An optical measurement method and system. The system includes, and method applies, a light source, a beamsplitter, at least one filter, a output photodetector for acquiring data of a sample, and a correction photodetector for correcting and maintaining output intensity from the light source. The filter is located between the light source and the correction photodetector for normalizing the spectrum of the input light being applied to input light correction. The filter may be incorporated into the beamsplitter and may be tuned to filter light from the light source for providing non-zero transmission of light with a near-zero gradient for wavelengths in a portion of the spectrum of the input light being applied to the sample and read by the output photodetector. The filter may also or alternatively be located downstream of the beamsplitter to correct for wavelength sensitivity of the correction photodetector.

Abstract: A filter and fabrication process for a thin film filter that is based on frustrated total internal reflection and multiple waveguide layers, in which the waveguide modes are resonantly coupled. The physics of the design is related to prism coupling of light into planar waveguides, and waveguide coupling between planar waveguides in close proximity. Embodiments include a filter that acts as a bandpass filter and polarizer, a filter that acts as a bandpass filter, polarizer and angle filter (spatial filter), a filter that is widely tunable, and a filter that is widely tunable in both peak transmission wavelength and width. Methods of fabrication are disclosed, and methods to correct for manufacturing errors in thin film deposition are described. The filter embodiments can also be used in reflection as notch filters in wavelength and angle, for a particular polarization component.

Abstract: A filter and fabrication process for a thin film filter that is based on frustrated total internal reflection and multiple waveguide layers, in which the waveguide modes are resonantly coupled. The physics of the design is related to prism coupling of light into planar waveguides, and waveguide coupling between planar waveguides in close proximity. Embodiments include a filter that acts as a bandpass filter and polarizer, a filter that acts as a bandpass filter, polarizer and angle filter (spatial filter), a filter that is widely tunable, and a filter that is widely tunable in both peak transmission wavelength and width. Methods of fabrication are disclosed, and methods to correct for manufacturing errors in thin film deposition are described. The filter embodiments can also be used in reflection as notch filters in wavelength and angle, for a particular polarization component.

Abstract: An apparatus and method are provided for optically measuring multiple parameters of a test sample at a regulated temperature. The test sample is held in a cuvette within a sample chamber or a fluidic channel on a fluidic chip. The temperature is sensed and modulated within a desired range. Either excitation light is directed through the test sample, and the emitted light is detected by a detector which converts the detected emission light into an output signal; or a probe light is directed to the test sample and at a detector. The output signal is transmitted to the control system which converts the output signal into output data representative of the fluorescence intensity, optical density and/or refractive index of the test sample.