Patents by Inventor Elran Gamzo

Elran Gamzo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 12664765
    Abstract: A computer-implemented method that, when executed by data processing hardware, causes the data processing hardware to perform operations comprising gathering sensor data from one or more sensors of a host vehicle, training a neural radiance fields (NeRF) network with the sensor data, selecting a vehicle configuration, developing a scene augmentation based on the vehicle configuration, generating a dataset based on the scene augmentation, and either (i) training a perception module with one or more perception detection tasks based on the dataset or (ii) evaluating a sensor configuration based on the dataset.
    Type: Grant
    Filed: May 22, 2024
    Date of Patent: June 23, 2026
    Assignee: GM Global Technology Operations LLC
    Inventors: Doron Portnoy, Elran Gamzo
  • Publication number: 20250363781
    Abstract: A computer-implemented method that, when executed by data processing hardware, causes the data processing hardware to perform operations comprising gathering sensor data from one or more sensors of a host vehicle, training a neural radiance fields (NeRF) network with the sensor data, selecting a vehicle configuration, developing a scene augmentation based on the vehicle configuration, generating a dataset based on the scene augmentation, and either (i) training a perception module with one or more perception detection tasks based on the dataset or (ii) evaluating a sensor configuration based on the dataset.
    Type: Application
    Filed: May 22, 2024
    Publication date: November 27, 2025
    Applicant: GM Global Technology Operations LLC
    Inventors: Doron Portnoy, Elran Gamzo
  • Patent number: 12423798
    Abstract: There is provided a system and method of examining a specimen comprising a first layer and a second layer. The method comprises obtaining a recipe including a template image for each reference polygon in a reference image and a template mask indicative of proximity of a set of locations in the template image to an edge of the reference polygon; obtaining an inspection image in runtime; identifying first inspection polygons in the inspection image corresponding to the first reference polygons using template images and template masks thereof; determining a first shift for the first layer based on the first locations, and registering the first reference polygons with the inspection image based on the first shift. Similarly, a second shift for the second layer can be determined, and the second reference polygons can be registered with the inspection image based on the second shift.
    Type: Grant
    Filed: August 3, 2022
    Date of Patent: September 23, 2025
    Assignee: Applied Materials Israel Ltd.
    Inventors: Gilad Vered, Dror Alumot, Uri Hadar, Elran Gamzo
  • Publication number: 20240046445
    Abstract: There is provided a system and method of examining a specimen comprising a first layer and a second layer. The method comprises obtaining a recipe including a template image for each reference polygon in a reference image and a template mask indicative of proximity of a set of locations in the template image to an edge of the reference polygon; obtaining an inspection image in runtime; identifying first inspection polygons in the inspection image corresponding to the first reference polygons using template images and template masks thereof; determining a first shift for the first layer based on the first locations, and registering the first reference polygons with the inspection image based on the first shift. Similarly, a second shift for the second layer can be determined, and the second reference polygons can be registered with the inspection image based on the second shift.
    Type: Application
    Filed: August 3, 2022
    Publication date: February 8, 2024
    Inventors: Gilad VERED, Dror ALUMOT, Uri HADAR, Elran GAMZO
  • Publication number: 20220129708
    Abstract: A method for image segmentation includes receiving, by a processing device, an image. The method further includes applying a machine learning model to the image, wherein the machine-learning model is trained by a training process comprising evaluating training outputs generated during the training process using a loss function. The method further includes obtaining, for each pixel of multiple pixels of the image, an output of the machine learning model within a multi-dimensional domain, wherein the output is obtained by providing the machine-learning model with pixels of different classes of segments of the image that are mapped to spaced apart clusters associated with different axes of the multi-dimensional domain. The method further includes determining, using the machine-learning model and for each pixel of multiple pixels of the image, a class of a segment that comprises the pixel by finding a closest axis to the output.
    Type: Application
    Filed: October 7, 2021
    Publication date: April 28, 2022
    Inventors: Elran Gamzo, Tomer Peled