Abstract: Selective grounding device for electronic equipment comprising a printed circuit board fastened to a grounding frame by a fastening screw inserted through an opening of the board comprising a first conductive pad surrounding the opening and located on the board side contacting the frame, a second and a third conductive pads, insulated from each other surrounding the opening on the opposite side of the board, the second pad being electrically connected to the first one, the third pad being electrically connected to the DC ground of the equipment, a washer selectively conductive or insulating, overlaying the second and third pad and clamped on said pads by the fastening screw, so that the DC ground is selectively connected or insulated form the frame ground depending on the washer being conductive or insulating, without need to differentiate, to this purpose, the printed circuit board.

Abstract: A probe support for a test fixture of printed circuit artworks comprising a base plate defining a supporting plane for connecting pins of a plurality of probes, a corresponding plurality of connecting elements, a cover plate designed to protect the contact tips of the probes and of connecting elements when the probe support is not to be used, etc. The base plate and the cover plate may be alternatively removed for set up and use respectively; the probes and the connecting elements being restrained to and protected by either the cover plate or the base plate. In this way both assembly of the probe support and the wiring harness between the probe pins and the pins of the connecting elements is made easier. The probe support further comprises a plate provided with a plurality of holes which house and axially guide the contact tips of the probes during active test.