Patents by Inventor Emad Hamadeh

Emad Hamadeh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Distributed test architecture for multiport RAMs or other circuitry
    Patent number: 6675336
    Abstract: An apparatus comprising a first circuit and a second circuit. The first circuit generally comprises a first built in self test (BIST) circuit configured to test the first circuit. The second circuit generally comprises a second BIST circuit configured to test the second circuit. The second circuit may not be adjacent to the first circuit.
    Type: Grant
    Filed: June 13, 2000
    Date of Patent: January 6, 2004
    Assignee: Cypress Semiconductor Corp.
    Inventors: Sangeeta Thakur, Emad Hamadeh, Pidugu L. Narayana
  • Circuit, architecture and method for reading an address counter and/or matching a bus width through one or more synchronous ports
    Patent number: 6510483
    Abstract: An apparatus comprising a first circuit, a second circuit, and a third circuit. The first circuit may be configured to select (i) a read-back address signal or (ii) a data signal as an output signal in response to one or more first control signals. The second circuit may be configured to generate (i) the read-back address signal and (ii) a cycle identification signal in response to an internal address signal and one or more second control signals. The third circuit may be configured to generate one or more I/O control signals in response to the cycle identification signal, where the one or more I/O control signals may determine the format of the output signal.
    Type: Grant
    Filed: March 21, 2000
    Date of Patent: January 21, 2003
    Assignee: Cypress Semiconductor Corp.
    Inventors: Stefan-Cristian Rezeanu, James Allan, Emad Hamadeh, Eric Gross, Vijay Srinivasaraghavan, Robert Manning