Patents by Inventor Emad Hreish

Emad Hreish has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for electromechanical testing and validation of probe cards
    Publication number: 20050017708
    Abstract: A method of testing a probe card includes the step of positioning the probe card in a prober over a verification wafer that is placed on a stage. The probe card is brought in contact with a contact region on the verification wafer. The verification wafer includes a shorting plane surrounding the contact region. A test signal is sent through the verification wafer to the probe card. A response signal from the probe card is received and analyzed.
    Type: Application
    Filed: July 1, 2003
    Publication date: January 27, 2005
    Inventors: Charles Miller, Emad Hreish