Patents by Inventor Emilio Yanine

Emilio Yanine has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and Apparatus of Analyzing Sample Surface Data
    Publication number: 20120265487
    Abstract: An improved apparatus and method for the analysis of surface data collected using a sub-micron scale metrology instrument which provides a persistent user experience by allocating set portions of the display to major functional regions thereby allowing a quick to learn and easy to user interface for the setup, analysis, and display of microscopic 3D surface data measurements and resulting analytic data with a variety of 3D surface scanners.
    Type: Application
    Filed: May 19, 2011
    Publication date: October 18, 2012
    Inventors: Emilio Yanine, Paul R. Unruh, Jon D. Herron, JR., Michael B. Krell, Son H. Bui, Joseph P. Moore, Dmitriy K. Kiselev, Ross O. Smith