Abstract: Optical frequency domain reflectometry (OFDR) circuitry to perform tasks on an optical fiber to generate calibration or correction data for calibrating or correcting a reference OFDR data set. A segmented technique is used which permits precise and accurate determination of the correction data for even initial and long fiber lengths. Correction information for each segment is stitched together to generate the correction data for the fiber.

Abstract: Optical frequency domain reflectometry (OFDR) circuitry to perform tasks on an optical fiber to generate calibration or correction data for calibrating or correcting a reference OFDR data set. A segmented technique is used which permits precise and accurate determination of the correction data for even initial and long fiber lengths. Correction information for each segment is stitched together to generate the correction data for the fiber.

Abstract: An optical frequency domain reflectometry (OFDR) measurement is produced from an OFDR apparatus that includes a tunable laser source coupled to a sensing interferometer and a monitor interferometer. The sensing interferometer is also coupled to a waveguide, e.g., an optical sensing fiber. Sensor interferometric data obtained by the OFDR measurement is processed in the spectral domain (e.g., frequency) with one or more parameters to compensate for the optical dispersion associated with the sensing interferometer data. A Fourier Transform of the dispersion-compensated sensing interferometric data in the spectral domain is performed to provide a dispersion-compensated OFDR measurement information in the temporal (e.g., time) domain.