Patents by Inventor Emmanuel J. Simeus

Emmanuel J. Simeus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Screening of electronic components for detection of counterfeit articles using automated inspection system
    Patent number: 9897560
    Abstract: A method includes selecting one or more analysis algorithms to be used to verify an authenticity of an electronic component. Each analysis algorithm identifies a type of data to be analyzed and/or a manner in which the data is to be collected. Each analysis algorithm also defines how the data is to be analyzed to verify the authenticity of the electronic component. The method also includes obtaining data associated with the electronic component. The method further includes analyzing the data associated with the electronic component using the one or more selected analysis algorithms to determine whether the electronic component is authentic. In addition, the method includes generating an output based on the analysis. One or more characteristics of the electronic component could be compared against one or more characteristics of at least one reference component, or variations in one or more characteristics of multiple electronic components could be identified.
    Type: Grant
    Filed: December 15, 2014
    Date of Patent: February 20, 2018
    Assignee: Raytheon Company
    Inventors: Dylan W. R. Martin, Edmundo M. Samaniego, John O. Crawford, Emmanuel J. Simeus, James E. Faoro
  • SCREENING OF ELECTRONIC COMPONENTS FOR DETECTION OF COUNTERFEIT ARTICLES USING AUTOMATED INSPECTION SYSTEM
    Publication number: 20160169818
    Abstract: A method includes selecting one or more analysis algorithms to be used to verify an authenticity of an electronic component. Each analysis algorithm identifies a type of data to be analyzed and/or a manner in which the data is to be collected. Each analysis algorithm also defines how the data is to be analyzed to verify the authenticity of the electronic component. The method also includes obtaining data associated with the electronic component. The method further includes analyzing the data associated with the electronic component using the one or more selected analysis algorithms to determine whether the electronic component is authentic. In addition, the method includes generating an output based on the analysis. One or more characteristics of the electronic component could be compared against one or more characteristics of at least one reference component, or variations in one or more characteristics of multiple electronic components could be identified.
    Type: Application
    Filed: December 15, 2014
    Publication date: June 16, 2016
    Inventors: Dylan W. R. Martin, Edmundo M. Samaniego, John O. Crawford, Emmanuel J. Simeus, James E. Faoro