Patents by Inventor Emmanuel Vanneau

Emmanuel Vanneau has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for measurement with an IR imaging device
    Patent number: 8933403
    Abstract: The present invention relates to a method and device for measuring at least two properties of an object, for some embodiments, said device comprising a measuring device for measuring at least one physical property of an object and an infrared imaging device for measuring at least one thermal property of an object, and wherein said first measuring device and said infrared imaging device are arranged to be synchronized to perform simultaneous measurements of the object.
    Type: Grant
    Filed: June 15, 2012
    Date of Patent: January 13, 2015
    Assignee: FLIR Systems AB
    Inventor: Emmanuel Vanneau
  • METHODS AND DEVICES FOR PRESENTING A MATERIAL STRESS ANALYSIS THROUGH CAPTURED IR IMAGES
    Publication number: 20150002654
    Abstract: Methods, devices, and systems are provided for presenting a material stress analysis based on infrared (IR), or thermal, images of a real world scene. A method may include receiving multiple consecutively captured IR images as a series of IR frames, wherein the series of IR frames are captured within a time window, obtaining a lock-in signal corresponding to said time window, generating a stress image based on the obtained lock-in signal and the received series of frames, and performing an operation on said stress image.
    Type: Application
    Filed: June 25, 2014
    Publication date: January 1, 2015
    Inventors: Pierre Bremond, Emmanuel Vanneau
  • METHOD AND DEVICE FOR MEASUREMENT WITH AN IR IMAGING DEVICE
    Publication number: 20120318984
    Abstract: The present invention relates to a method and device for measuring at least two properties of an object, for some embodiments, said device comprising a measuring device for measuring at least one physical property of an object and an infrared imaging device for measuring at least one thermal property of an object, and wherein said first measuring device and said infrared imaging device are arranged to be synchronized to perform simultaneous measurements of the object.
    Type: Application
    Filed: June 15, 2012
    Publication date: December 20, 2012
    Inventor: Emmanuel Vanneau