Patents by Inventor Emory J. Harry

Emory J. Harry has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5903162
    Abstract: An adapter for a measurement test instrument electrical probe has a flexible dielectric substrate with electrically conductive runs thereon. One end of the conductive runs has first electrical contacts with a pitch geometry corresponding to the pitch geormetry of electrical contacts of an electronic device that is electically connected to a substrate via the electrical contacts of the device. The other end of the conductive runs has second electrical contacts that have a pitch geometry compatible with the electrical probe of the measurement test instrument.
    Type: Grant
    Filed: October 14, 1997
    Date of Patent: May 11, 1999
    Assignee: Tektronix, Inc.
    Inventors: Paul A. Cole, Emory J. Harry, Michael A. Wright
  • Patent number: 5548223
    Abstract: An adapter for a measurement test instrument electrical probe has a flexible dielectric substrate with electrically conductive runs thereon. One end of the conductive runs has first electrical contacts with a pitch geometry corresponding to the pitch geometry of electrical contacts of an electronic device that is electrically connected to a substrate via the electrical contacts of the device. The other end of the conductive runs has second electrical contacts that have a pitch geometry compatible with the electrical probe of the measurement test instrument.
    Type: Grant
    Filed: February 16, 1995
    Date of Patent: August 20, 1996
    Assignee: Tektronix, Inc.
    Inventors: Paul A. Cole, Emory J. Harry, Michael A. Wright
  • Patent number: 4783625
    Abstract: An active electrical test probe with wideband frequency capability for use on a test probe card, along with other test probes. A small hybrid integrated circuit is mounted on a substrate held on edge, adjacent the probe tip contact element of the probe, by a conductive metal clip. The circuit is provided power from an external source. Signals received by the probe tip are transmitted, as modified by the hybrid integrated circuit, through an output cable to electronic test equipment.
    Type: Grant
    Filed: March 14, 1988
    Date of Patent: November 8, 1988
    Assignee: Tektronix, Inc.
    Inventors: Emory J. Harry, Matthew J. Hadwin, John D. Garcia
  • Patent number: 4739259
    Abstract: A probe for use in electrical circuit test equipment, in which a contact element is longitudinally slidable in an insulator sleeve which also contains an R-C attenuator circuit connected electrically to the contact element by an electrically conductive elastomeric material. A high impedance cable is connected electrically to the other end of the RC attenuator circuit by another piece of conductive elastomeric material. The cable connects the attenuator to another R-C circuit which, together with the attenuator, forms a voltage divider, and the attenuated signal controls an amplifier which provides a signal through a low impedance cable to a test equipment.
    Type: Grant
    Filed: August 1, 1986
    Date of Patent: April 19, 1988
    Assignee: Tektronix, Inc.
    Inventors: Matthew J. Hadwin, John D. Garcia, Emory J. Harry