Abstract: An electronic device may have a display with touch sensors. One or more shielding layers may be interposed between the display and the touch sensors. The shielding layers may include shielding structures such as a conductive mesh structure and/or a transparent conductive film. The shielding structures may be actively driven or passively biased. In the active driving scheme, one or more inverting circuits may receive a noise signal from a cathode layer in the display and/or from the shielding structures, invert the received noise signal, and drive the inverted noise signal back onto the shielding structures to prevent any noise from the display from negatively impacting the performance of the touch sensors. In the passive biasing scheme, the shielding structures may be biased to a power supply voltage.

Abstract: A method for inspecting a transparent workpiece comprises: directing light from an illumination source onto a plurality of defects formed in the transparent workpiece, wherein the plurality of defects extends in a defect direction, wherein the transparent workpiece comprises a first surface and a second surface; detecting a scattering image signal from light scattered by the plurality of defects using an imaging system, wherein an imaging axis of the imaging system extends at a non-zero imaging angle relative to the defect direction, wherein entireties of at least a subset of the plurality of defects are within a depth of field of the imaging system; and generating a three-dimensional image of at least one of the plurality of defects based on the scattering signal.

Abstract: Defect detection systems include at least one nozzle for delivering a CO2 particulate fluid to an inlet end of a plugged honeycomb body. Defects in the honeycomb, if any, are determined by monitoring CO2 particulate flow at the outlet end of the honeycomb body. Methods for detecting defects in plugged honeycomb bodies are also disclosed.

Abstract: A surface inspection system for foil article is disclosed. The surface inspection system comprises a box having a top long narrow opening and a bottom long narrow opening, a bridge interface, a first light source, a second light source, a first modular camera device having a first camera, and a second modular camera device having a second camera. In which, the first light source, the second light source, the first modular camera device, and the second modular camera device all accommodated in the box, and are coupled to a control box through the bridge interface. Particularly, this surface inspection system is allowed to be integrated in an automatic production line of a foil article like electro-forming aluminum foil (also called electronic aluminum foil), so as to achieve an in-line inspection of the surface morphology of the electro-forming aluminum foil.

Abstract: Defect detection systems include at least one nozzle for delivering a CO2 particulate fluid to an inlet end of a plugged honeycomb body. Defects in the honeycomb, if any, are determined by monitoring CO2 particulate flow at the outlet end of the honeycomb body. Methods for detecting defects in plugged honeycomb bodies are also disclosed.

Abstract: A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.

Abstract: A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively.

Abstract: A method of inspecting defects on a transparent substrate may include: selecting a gradient of an illumination optical system so that light incident on the transparent substrate has a first angle; selecting a gradient of a detection optical system so that an optical axis of the detection optical system located over the transparent substrate has a second angle, which is equal to or less than the first angle; adjusting a position of at least one of the illumination optical system, the transparent substrate, and the detection optical system so that a field-of-view of the detection optical system covers a first region where the light meets a first surface of the transparent substrate and does not cover a second region where light meets a second surface of the transparent substrate, the second surface being opposite to the first surface; illuminating the transparent substrate; and detecting light scattered from the transparent substrate.

Abstract: A method of inspecting defects of a transparent substrate may include: illuminating a transparent substrate; calculating an incidence angle range of light so that a first region where the light meets a first surface of the transparent substrate and a second region where light meets a second surface being opposite the first surface of the transparent substrate do not overlap each other; adjusting an incidence angle according to the incidence angle range; adjusting a position of a first detector so that a first field-of-view of the first detector covers the first region and does not cover the second region; adjusting a position of a second detector so that a second field-of-view of the second detector covers the second region and does not cover the first region; and obtaining a first image of the first region and a second image of the second region from the first and second detector, respectively.

Abstract: Systems and methods of measuring ferrule-core concentricity for an optical fiber held by a ferrule are disclosed. The method includes: generating ferrule distance data by measuring distances to a ferrule outside surface as a function of rotation angle using a distance sensor and rotating either the ferrule or the distance sensor about an axis of rotation that is off-center from the true ferrule axis; aligning the axis of rotation with the fiber core; using the ferrule distance data to determine a position of the true ferrule center relative to the optical fiber core; and measuring the concentricity as the distance between the true center of the ferrule and the optical fiber core.

Abstract: Systems and methods of measuring ferrule-core concentricity for an optical fiber held by a ferrule are disclosed. The method includes: generating ferrule distance data by measuring distances to a ferrule outside surface as a function of rotation angle using a distance sensor and rotating either the ferrule or the distance sensor about an axis of rotation that is off-center from the true ferrule axis; aligning the axis of rotation with the fiber core; using the ferrule distance data to determine a position of the true ferrule center relative to the optical fiber core; and measuring the concentricity as the distance between the true center of the ferrule and the optical fiber core.

Abstract: Systems and methods of measuring ferrule-core concentricity for an optical fiber held by a ferrule are disclosed. The method includes: generating ferrule distance data by measuring distances to a ferrule outside surface as a function of rotation angle using a distance sensor and rotating either the ferrule or the distance sensor about an axis of rotation that is off-center from the true ferrule axis; aligning the axis of rotation with the fiber core; using the ferrule distance data to determine a position of the true ferrule center relative to the optical fiber core; and measuring the concentricity as the distance between the true center of the ferrule and the optical fiber core.

Abstract: A method for determining surface quality for a glass surface is provided. The method includes depositing a pattern of drops over the glass surface using a drop dispensing apparatus. Adjacent drops have a predetermined deposit size and a predetermined deposit spacing. Drop information for the pattern of drops is generated using a vision apparatus. An out-of-parameter condition is detected by analyzing the drop information and an indication of the out-of-parameter condition is provided.

Abstract: Systems and methods of measuring ferrule-core concentricity for an optical fiber held by a ferrule are disclosed. The method includes: generating ferrule distance data by measuring distances to a ferrule outside surface as a function of rotation angle using a distance sensor and rotating either the ferrule or the distance sensor about an axis of rotation that is off-center from the true ferrule axis; aligning the axis of rotation with the fiber core; using the ferrule distance data to determine a position of the true ferrule center relative to the optical fiber core; and measuring the concentricity as the distance between the true center of the ferrule and the optical fiber core.

Abstract: A method for determining surface quality for a glass surface is provided. The method includes depositing a pattern of drops over the glass surface using a drop dispensing apparatus. Adjacent drops have a predetermined deposit size and a predetermined deposit spacing. Drop information for the pattern of drops is generated using a vision apparatus. An out-of-parameter condition is detected by analyzing the drop information and an indication of the out-of-parameter condition is provided.

Abstract: A positioning apparatus, a positioning method, and a computer program product thereof are provided. The positioning apparatus is used to calculate a self-position. The positioning apparatus can communicate with a reference apparatus and comprises a transceiving unit, a storage unit and a processing unit. The transceiving unit is configured to receive a received signal strength indicator (RSSI) from the reference apparatus. The storage unit is configured to store attenuating factor data. The processing unit is configured to retrieve an attenuating factor corresponding to the RSSI from the attenuating factor data and calculate the self-position according to the RSSI and the attenuating factor.