Abstract: A system for measuring the junction temperature of a photonics device comprising a) a test chamber, wherein a photonics device to be tested is placed inside, b) at least one heater, c) at least one temperature sensor, d) a source-meter configured to apply a driving current to the photonics device in order to read the corresponding forward voltage value at that temperature, e) a power supply, f) a control system and g) a software configured to start and control the measurements with either predefined default settings or the settings entered by the user.

Abstract: A lighting system has a dielectric cooling fluid which directly contacts with an LED chip; contacts with the heat sink base by moving towards the heat sink base, i.e. upwards, with the decreasing density as a result of the increased temperature due to the high temperature formed in the LED chip; at the same time the temperature thereof decreasing upon contacting with the heat sink base; moves towards the LED chip, and reduces the temperature of the LED chip by contacting the LED chip upon said movement; and movement channels through which the cooling fluid in gaseous or liquid phase passes during the movement of said cooling fluid.

Abstract: A lighting system has a dielectric cooling fluid which directly contacts with an LED chip; contacts with the heat sink base by moving towards the heat sink base, i.e. upwards, with the decreasing density as a result of the increased temperature due to the high temperature formed in the LED chip; at the same time the temperature thereof decreasing upon contacting with the heat sink base; moves towards the LED chip, and reduces the temperature of the LED chip by contacting the LED chip upon said movement; and movement channels through which the cooling fluid in gaseous or liquid phase passes during the movement of said cooling fluid.