Patents by Inventor Eng C. Born

Eng C. Born has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5781551
    Abstract: This is a method and system of communicating on a data and computer communications network.
    Type: Grant
    Filed: September 15, 1994
    Date of Patent: July 14, 1998
    Assignee: Texas Instruments Incorporated
    Inventor: Eng C. Born
  • Patent number: 5613070
    Abstract: This is a method and system of communicating on a data and computer communications network.
    Type: Grant
    Filed: June 7, 1995
    Date of Patent: March 18, 1997
    Assignee: Texas Instrument Incorporated
    Inventor: Eng C. Born
  • Patent number: 5070297
    Abstract: A full wafer integrated circuit testing device (10) tests integrated circuits (15) formed as a wafer in conjunction with a test control unit (40). Probe units (14) associate with respective integrated circuits (15). Probe tips (16) on probe units (14) communicate with respective pads (19) with the integrated circuits (15). Interface circuitry (36) selectively communicates test data between the test control unit (40) and the integrated circuit (15). Test pins (16) have positions on probe units (14) associated with respective integrated circuit connection points (19) for testing associated integrated circuit (15) components. Interface circuitry (36) includes comparators (54 and 56) that compare signals between the integrated circuit (15) and the test control unit (40). Memory components (66 and 68) store data associated with signals from test control unit (40) and said integrated circuit (15).
    Type: Grant
    Filed: June 4, 1990
    Date of Patent: December 3, 1991
    Assignee: Texas Instruments Incorporated
    Inventors: Oh-Kyong Kwon, Masashi Hashimoto, Satwinder Malhi, Eng C. Born