Patents by Inventor Enio Frota Da Silveira

Enio Frota Da Silveira has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ion source for compact mass spectrometer and method of mass analyzing a sample
    Patent number: 5852295
    Abstract: A mass spectrometer 20 includes an electron multiplier 30 for producing an electron avalanche 58 directed toward an ionization region 38. A sample 40 enters the ionization region 38 through a sample inlet 68. In the ionization region 38 the electron avalanche 58 collides with the sample 40 and produces ions 60. A start detector 56 detects the electron avalanche 58 and provides a start signal. The ions 60 exit the ionization region 38 and enter a flight region 26. The ions 60 flow through the flight region 26 and interact with a stop detector 42. The stop detector 42 generates a stop signal in response to being activated. A low pressure enclosure 22 encloses at least the electron multiplier 30 and the ionization region 38. The start and stop signals are supplied to an analysis system for determining the mass of the sample using time-of-flight mass spectrometry.
    Type: Grant
    Filed: April 7, 1997
    Date of Patent: December 22, 1998
    Assignee: The Texas A&M University System
    Inventors: Enio Frota Da Silveira, Kevin Bernard Ray, Emile Alfred Schweikert, Melvin Andrew Park
  • Ion source for compact mass spectrometer and method of mass analyzing a sample
    Patent number: 5659170
    Abstract: A mass spectrometer 20 includes an electron multiplier 30 for producing an electron avalanche 58 directed toward an ionization region 38. A sample 40 enters the ionization region 38 through a sample inlet 68. In the ionization region 38 the electron avalanche 58 collides with the sample 40 and produces ions 60. A start detector 56 detects the electron avalanche 58 and provides a start signal. The ions 60 exit the ionization region 38 and enter a flight region 26. The ions 60 flow through the flight region 26 and interact with a stop detector 42. The stop detector 42 generates a stop signal in response to being activated. A low pressure enclosure 22 encloses at least the electron multiplier 30 and the ionization region 38. The start and stop signals are supplied to an analysis system for determining the mass of the sample using time-of-flight mass spectrometry.
    Type: Grant
    Filed: December 16, 1994
    Date of Patent: August 19, 1997
    Assignee: The Texas A&M University System
    Inventors: Enio Frota Da Silveira, Kevin Bernard Ray, Emile Alfred Schweikert, Melvin Andrew Park