Patents by Inventor Enn Tan

Enn Tan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20080001769
    Abstract: A method and apparatus for batch testing of RFID straps are provided. The RFID straps are arranged on a carrier web in a closely spaced relationship, where each strap includes two terminal pads exposed on the carrier web and an RFID chip. The carrier web is moved so as to align all straps in a batch with corresponding test probes of a test equipment. Each test probe is moved transversely to the moving direction of the carrier web into close proximity with a corresponding strap. A capacitive coupling is established between test electrodes on each test probe and the terminal pads of a corresponding strap. Test signals are then transmitted from each test probe to a corresponding strap, and response signals are received at each test probe from a corresponding strap for evaluation by the test equipment.
    Type: Application
    Filed: June 22, 2007
    Publication date: January 3, 2008
    Applicant: TEXAS INSTRUMENTS, DEUTSCHLAND GMBH
    Inventors: Juergen Mayer-Zintel, Enn Tan, Konstantin Aslanidis