Abstract: Apparatus for protection of electronics in a radiation-prone environment from incoming particles that may cause damage, comprises one or more radiation-detecting layers extending at least partially over one or more sides of a radiation-sensitive electronic device that needs protection, the radiation-detecting layer being configured to obtain an estimate of a characteristic, such as the LET (linear energy transfer), of the incoming particle, A stress assessment unit determines whether the measured characteristic implies a threat to the radiation-sensitive electronic device, and if it does, then a protection module associated with the stress-assessment unit powers down all or part of the radiation-sensitive electronic device within a predetermined time after the incoming particle has been detected, thereby to protect the radiation sensitive electronic device from damage due to the detected particle. The power down is typically completed within a short enough time to avoid damage.