Abstract: A flip-flop circuit may be used to latch data responsive to an edge of a clock signal. An example flip-flop circuit includes a first latch which latches a value of the data when the clock is at a level, a NAND gate coupled to the output of the first latch and the clock signal, and a second latch which is set to provide a high logical output based on the output of the NAND gate. In this way, the second latch is set on a next rising edge of the clock signal. The flip-flop circuit may be faster and more consistent than a conventional flip-flop. In an example application, the flip-flop circuit may be used as part of a synchronizer circuit in a memory device for external write leveling.

Abstract: An apparatus having a power bus supplying power to a component of a memory device. The apparatus includes a noise source circuit generating a plurality of noise source signals that simulate a real-world noise. The apparatus can include a pulse generator circuit that receives the noise source signal and outputs at least one noise profile signal based on the noise source signal. A bus shorting circuit can be connected to the pulse generator circuit to receive the at least one noise profile signal. The bus shorting circuit can have at least one transistor connected between a first rail and a second rail of the power bus. Based on the at least one noise profile signal, the bus shorting circuit intermittently connects the at least one transistor between the first rail to the second rail to induce noise on the power bus.

Abstract: A time to digital circuit may provide a time measurement of an event, or a time measurement of a duration between multiple events. Various electronic devices may include one or more time to digital circuits. A time to digital circuit may include circuitry to use Thermometer Code for measuring the duration of the time. For example, the time to digital circuit may generate alternating signals using a ring oscillator when receiving an indication of an event. Moreover, the time to digital circuit may convert the alternating signals to a consistent signal with only one transition between high and low signals in multiple consecutive signals. Furthermore, the time to digital circuit may correct erroneous signal values of the consistent signals when multiple transitions between high and low signals in multiple consecutive signals occurs.

Abstract: A time to digital circuit may provide a time measurement of an event, or a time measurement of a duration between multiple events. Various electronic devices may include one or more time to digital circuits. A time to digital circuit may include circuitry to use Thermometer Code for measuring the duration of the time. For example, the time to digital circuit may generate alternating signals using a ring oscillator when receiving an indication of an event. Moreover, the time to digital circuit may convert the alternating signals to a consistent signal with only one transition between high and low signals in multiple consecutive signals. Furthermore, the time to digital circuit may correct erroneous signal values of the consistent signals when multiple transitions between high and low signals in multiple consecutive signals occurs.

Abstract: An apparatus having a power bus supplying power to a component of a memory device. The apparatus includes a noise source circuit generating a plurality of noise source signals that simulate a real-world noise. The apparatus can include a pulse generator circuit that receives the noise source signal and outputs at least one noise profile signal based on the noise source signal. A bus shorting circuit can be connected to the pulse generator circuit to receive the at least one noise profile signal. The bus shorting circuit can have at least one transistor connected between a first rail and a second rail of the power bus. Based on the at least one noise profile signal, the bus shorting circuit intermittently connects the at least one transistor between the first rail to the second rail to induce noise on the power bus.

Abstract: Apparatuses and methods for capturing data in a memory are disclosed herein. An apparatus may include a command path and a data capture logic. The command path may be configured to receive a command signal and to delay the command signal with a delay based, at least in part, on a plurality of propagation delays. The data capture logic may be coupled to the command path and configured to receive the delayed command signal and a data strobe signal. The data capture logic may further be configured to capture data according to the data strobe signal responsive, at least in part, to receipt of the delayed command signal.

Abstract: Apparatuses and methods for capturing data in a memory are disclosed herein. An apparatus may include a command path and a data capture logic. The command path may be configured to receive a command signal and to delay the command signal with a delay based, at least in part, on a plurality of propagation delays. The data capture logic may be coupled to the command path and configured to receive the delayed command signal and a data strobe signal. The data capture logic may further be configured to capture data according to the data strobe signal responsive, at least in part, to receipt of the delayed command signal.