Patents by Inventor Eric A. Norige

Eric A. Norige has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Built-in self-test for network on chip fabric
    Patent number: 12332309
    Abstract: A system comprising a network-on-chip (NOC) fabric comprising a plurality of routes to communicate data between a plurality of agents; a plurality of built-in self-test (BIST) generators, wherein a BIST generator of the plurality of BIST generators is coupled between an agent of the plurality of agents and the NOC fabric and is to transmit at least one test pattern through the NOC fabric; and a plurality of BIST checkers, wherein a BIST checker of the plurality of BIST checkers is coupled between the agent of the plurality of agents and the NOC fabric and is to receive at least one test pattern through the NOC fabric from at least one of the plurality of BIST generators and to verify whether the at least one test pattern was transmitted correctly through the NOC fabric.
    Type: Grant
    Filed: August 11, 2021
    Date of Patent: June 17, 2025
    Assignee: Intel Corporation
    Inventors: Dawn Maxon, Eric A. Norige, Joji Philip, William John Bainbridge, Joseph B. Rowlands
  • BUILT-IN SELF-TEST FOR NETWORK ON CHIP FABRIC
    Publication number: 20210373075
    Abstract: A system comprising a network-on-chip (NOC) fabric comprising a plurality of routes to communicate data between a plurality of agents; a plurality of built-in self-test (BIST) generators, wherein a BIST generator of the plurality of BIST generators is coupled between an agent of the plurality of agents and the NOC fabric and is to transmit at least one test pattern through the NOC fabric; and a plurality of BIST checkers, wherein a BIST checker of the plurality of BIST checkers is coupled between the agent of the plurality of agents and the NOC fabric and is to receive at least one test pattern through the NOC fabric from at least one of the plurality of BIST generators and to verify whether the at least one test pattern was transmitted correctly through the NOC fabric.
    Type: Application
    Filed: August 11, 2021
    Publication date: December 2, 2021
    Applicant: Intel Corporation
    Inventors: Dawn Maxon, Eric A. Norige, Joji Philip, William John Bainbridge, Joseph B. Rowlands