Patents by Inventor Eric Bernillon

Eric Bernillon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing of integrated circuits using test module
    Patent number: 7941722
    Abstract: A method and apparatus for testing of integrated circuits using a Direct Memory Load Execute Dump (DMLED) test module. The method includes loading a test case into a memory using the DMLED test module, loading initialization signatures of fixed pattern into the memory using the DMLED test module, and executing the test case at an operating clock rate of a processor. The method further includes writing result signatures into the memory, and dumping the results signatures from the memory to a tester using the DMLED test module.
    Type: Grant
    Filed: June 9, 2008
    Date of Patent: May 10, 2011
    Assignee: Texas Instruments Incorporated
    Inventors: Pascal Cussonneau, Eric Bernillon
  • Testing of Integrated Circuits Using Test Module
    Publication number: 20080320347
    Abstract: A method and apparatus for testing of integrated circuits using a Direct Memory Load Execute Dump (DMLED) test module. The method includes loading a test case into a memory using the DMLED test module, loading initialization signatures of fixed pattern into the memory using the DMLED test module, and executing the test case at an operating clock rate of a processor. The method further includes writing result signatures into the memory, and dumping the results signatures from the memory to a tester using the DMLED test module.
    Type: Application
    Filed: June 9, 2008
    Publication date: December 25, 2008
    Applicant: Texas Instruments Incorporated
    Inventors: Pascal Cussonneau, Eric Bernillon