Abstract: A method is presented for controlling process delay times between a) thin film deposition and lubricant application, and b) lubricant application and abrasive polishing. Applicants have discovered that for certain lubricants, a minimum delay time after the overcoat has been deposited before the lubricant is applied increases the number of disks passing the glide test after abrasive polishing. In addition, applicants have discovered that for certain lubricants, the abrasive polishing should take place within a maximum time window following the application of the lubricant. A computerized work-in-progress tracking system is preferably used to implement the method of the invention.

Abstract: A system for use in a memory disk test system is disclosed. The system comprises a fixture for holding a disk head and a moveable slide coupled to the fixture. The system includes a non-magnetic motor system engageably coupled to the slide for moving the test fixture. A system and method in accordance with the present invention offers an SDT system which utilizes piezoelectric motors resulting in higher throughput in producing memory disks. The system and method further achieves high performance, is lower cost in implementation, and is more compact than conventional SDT systems. The system and method, by removing time delay, offers the advantage of cycle time reduction over conventional SDT systems.