Patents by Inventor Eric C. Schneider
Eric C. Schneider has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230097178Abstract: Methods, apparatuses and systems directed to pattern learning, recognition, and metrology. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In certain implementations, the present invention provides for methods and systems suitable for analyzing and recognizing patterns in biological signals such as multi-electrode array waveform data. In other implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes. In other implementations, the present invention provides methods and systems for dynamic learning of patterns in supervised and unsupervised manners.Type: ApplicationFiled: August 2, 2022Publication date: March 30, 2023Inventors: Tyson J. Thomas, Kristopher Robert Buschelman, Frank G. Evans, Karl P. Geiger, Michael P. Kelley, Eric C. Schneider, Timothy J. Carruthers, Jeffrey Brian Adams
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Patent number: 11461683Abstract: Methods, apparatuses and systems directed to pattern learning, recognition, and metrology. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In certain implementations, the present invention provides for methods and systems suitable for analyzing and recognizing patterns in biological signals such as multi-electrode array waveform data. In other implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes. In other implementations, the present invention provides methods and systems for dynamic learning of patterns in supervised and unsupervised manners.Type: GrantFiled: April 9, 2020Date of Patent: October 4, 2022Assignee: DataShapes, Inc.Inventors: Tyson J. Thomas, Kristopher Robert Buschelman, Frank G. Evans, Karl P. Geiger, Michael P. Kelley, Eric C. Schneider, Timothy J. Carruthers, Jeffrey Brian Adams
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Publication number: 20200272921Abstract: Methods, apparatuses and systems directed to pattern learning, recognition, and metrology. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In certain implementations, the present invention provides for methods and systems suitable for analyzing and recognizing patterns in biological signals such as multi-electrode array waveform data. In other implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes. In other implementations, the present invention provides methods and systems for dynamic learning of patterns in supervised and unsupervised manners.Type: ApplicationFiled: April 9, 2020Publication date: August 27, 2020Inventors: Tyson J. Thomas, Kristopher Robert Buschelman, Frank G. Evans, Karl P. Geiger, Michael P. Kelley, Eric C. Schneider, Timothy J. Carruthers, Jeffrey Brian Adams
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Patent number: 10657451Abstract: Methods, apparatuses and systems directed to pattern learning, recognition, and metrology. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In certain implementations, the present invention provides for methods and systems suitable for analyzing and recognizing patterns in biological signals such as multi-electrode array waveform data. In other implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes. In other implementations, the present invention provides methods and systems for dynamic learning of patterns in supervised and unsupervised manners.Type: GrantFiled: August 28, 2014Date of Patent: May 19, 2020Assignee: Rokio, Inc.Inventors: Tyson J. Thomas, Kristopher Robert Buschelman, Frank G. Evans, Karl P. Geiger, Michael P. Kelley, Eric C. Schneider, Timothy J. Carruthers, Jeffrey Brian Adams
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Publication number: 20150178631Abstract: Methods, apparatuses and systems directed to pattern learning, recognition, and metrology. In some particular implementations, the invention provides a flexible pattern recognition platform including pattern recognition engines that can be dynamically adjusted to implement specific pattern recognition configurations for individual pattern recognition applications. In certain implementations, the present invention provides for methods and systems suitable for analyzing and recognizing patterns in biological signals such as multi-electrode array waveform data. In other implementations, the present invention also provides for a partition configuration where knowledge elements can be grouped and pattern recognition operations can be individually configured and arranged to allow for multi-level pattern recognition schemes. In other implementations, the present invention provides methods and systems for dynamic learning of patterns in supervised and unsupervised manners.Type: ApplicationFiled: August 28, 2014Publication date: June 25, 2015Inventors: Tyson J. Thomas, Kristopher Robert Buschelman, Frank G. Evans, Karl P. Geiger, Michael P. Kelley, Eric C. Schneider, Timothy J. Carruthers, Jeffrey Brian Adams
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Patent number: 4571638Abstract: A self-scanning linear array (10) is moved (12) in the image plane of a lens to thereby scan the image of an object which has been focused in the image plane. A random access controller controls random access to the information within the scanned image. Commands (14) including mechanical positional parameters (16) and electronic scan parameters (18) are decoded by the master microprocessor (20). The electronic scan parameters in the command provide information such as a user selected transverse axis frame size scan output of the array. An address generator (22) generates addresses in response to output pulses from the array. A windowing sequencer (24) in conjunction with the address generator (22) selectively gates particular ones of the pulses in the train of output pulses from the array in accordance with the electronic scan parameters in the command.Type: GrantFiled: May 2, 1983Date of Patent: February 18, 1986Assignee: Datacopy CorporationInventors: Eric C. Schneider, Elaine Hebard, Stuart D. Rumley