Patents by Inventor Eric Chin

Eric Chin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250183071
    Abstract: Disclosed systems and techniques are directed to interferometry-based temperature monitoring of various operations performed in manufacturing systems. For example, the disclosed techniques include directing an incident light to a sample and detecting a plurality of interference patterns (IPs) associated with a light departing from the sample. The light departing from the sample can be generated upon interaction of the incident light with the sample. Each IP of the plurality of IPs can be associated with a respective temperature of a plurality of temperatures of the sample. The techniques further include determining, using the plurality of IPs, a temperature difference between a first temperature of the plurality of temperatures and a second temperature of the plurality of temperatures.
    Type: Application
    Filed: December 2, 2024
    Publication date: June 5, 2025
    Inventors: Eric Chin Hong Ng, Mehdi Vaez-Iravani
  • Publication number: 20250164238
    Abstract: A system includes a radiation source configured to emit a radiation beam, a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object, a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object, and a third optical sensor configured to detect a third intensity of a third portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor, the second optical sensor, and the third optical sensor. The processing device is configured to determine a roughness or an emissivity of the surface of the object based on a comparison of two or more of the first intensity, the second intensity, or the third intensity.
    Type: Application
    Filed: November 16, 2023
    Publication date: May 22, 2025
    Inventors: Eric Chin Hong Ng, Todd Jonathan Egan, Mayu Felicia Yamamura, Phillip William Peters, Christopher Beaudry, Mehdi Vaez-Iravani
  • Publication number: 20250125171
    Abstract: A method includes identifying a first growth rate of a first region of a substrate associated with one or more substrate deposition processes performed in a processing chamber of substrate processing equipment. The method further includes determining, based on the first growth rate, thickness data of a second region of the substrate without second structure data of the second region. The thickness data is determined in a non-destructive manner. The method further includes causing performance of an action associated with processing one or more substrates via the processing chamber of the substrate processing equipment based on the thickness data of the second region of the substrate.
    Type: Application
    Filed: December 23, 2024
    Publication date: April 17, 2025
    Inventors: Eric Chin Hong Ng, Edward Wibowo Budiarto, Mehdi Vaez-Iravani, Todd Jonathan Egan, Venkatakaushik Voleti
  • Patent number: 12211717
    Abstract: A method includes identifying first structure data of a first region of a substrate and receiving optical metrology data of the substrate associated with one or more substrate deposition processes in a processing chamber. The method further includes determining, based on the optical metrology data and the first structure data, a first growth rate of the first region of the substrate associated with the one or more substrate deposition processes. The method further includes predicting, based on the optical metrology data and the first growth rate, thickness data of a second region of the substrate without second structure data of the second region.
    Type: Grant
    Filed: March 29, 2021
    Date of Patent: January 28, 2025
    Assignee: Applied Materials, Inc.
    Inventors: Eric Chin Hong Ng, Edward Wibowo Budiarto, Mehdi Vaez-Iravani, Todd Jonathan Egan, Venkatakaushik Voleti
  • Patent number: 12098914
    Abstract: A system includes a radiation source configured to emit a radiation beam. The system further includes a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object. The system further includes a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor and the second optical sensor. The processing device is configured to determine at least one of a roughness or an emissivity of the surface of the object based on a comparison of the first intensity and the second intensity.
    Type: Grant
    Filed: September 29, 2022
    Date of Patent: September 24, 2024
    Assignee: Applied Materials, Inc.
    Inventors: Eric Chin Hong Ng, Todd J. Egan, Mehdi Vaez-Iravani
  • Patent number: 12062583
    Abstract: An optical metrology model for in-line thickness measurements of a film overlying non-ideal structures on a substrate is generated by performing pre-measurements prior to deposition of the film and performing post-measurements after the deposition. The pre- and post-measurements are performed at at least one of multiple polarization angles or multiple orientations of the substrate. Differences in reflectance between the pre- and post-measurements are determined at the multiple polarization angles and the multiple orientations. At least one of the multiple polarization angles or the multiple orientations are identified where the differences in reflectance are indicative of a suppressed influence from the non-ideal structures. The optical metrology model is generated using the identified polarization angles and the identified orientations as inputs to a machine-learning algorithm.
    Type: Grant
    Filed: March 11, 2021
    Date of Patent: August 13, 2024
    Assignee: Applied Materials Israel Ltd.
    Inventors: Eric Chin Hong Ng, Edward Budiarto, Sergey Starik, Todd J. Egan
  • Publication number: 20240110782
    Abstract: A system includes a radiation source configured to emit a radiation beam. The system further includes a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object. The system further includes a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor and the second optical sensor. The processing device is configured to determine at least one of a roughness or an emissivity of the surface of the object based on a comparison of the first intensity and the second intensity.
    Type: Application
    Filed: September 29, 2022
    Publication date: April 4, 2024
    Inventors: Eric Chin Hong Ng, Todd J. Egan, Mehdi Vaez-Iravani
  • Publication number: 20230398095
    Abstract: A method for treating age-related macular degeneration (AMD), either wet AMD or dry AMD. In the method, a therapeutic agent is administered to the patient. The therapeutic agent includes an antioxidant carbazole moiety fused to a nicotine analog. The patient is then monitored to determine the state of the age-related macular degeneration. The therapeutic agent may be administered orally, by injection, or by eye drops in preferred embodiments.
    Type: Application
    Filed: June 10, 2022
    Publication date: December 14, 2023
    Inventors: Ahmad Alkayali, David Almeida, Eric Chin
  • Publication number: 20220310425
    Abstract: A method includes identifying first structure data of a first region of a substrate and receiving optical metrology data of the substrate associated with one or more substrate deposition processes in a processing chamber. The method further includes determining, based on the optical metrology data and the first structure data, a first growth rate of the first region of the substrate associated with the one or more substrate deposition processes. The method further includes predicting, based on the optical metrology data and the first growth rate, thickness data of a second region of the substrate without second structure data of the second region.
    Type: Application
    Filed: March 29, 2021
    Publication date: September 29, 2022
    Inventors: Eric Chin Hong Ng, Edward Wibowo Budiarto, Mehdi Vaez-Iravani, Todd Jonathan Egan, Venkatakaushik Voleti
  • Publication number: 20220290974
    Abstract: An optical metrology model for in-line thickness measurements of a film overlying non-ideal structures on a substrate is generated by performing pre-measurements prior to deposition of the film and performing post-measurements after the deposition. The pre- and post-measurements are performed at at least one of multiple polarization angles or multiple orientations of the substrate. Differences in reflectance between the pre- and post-measurements are determined at the multiple polarization angles and the multiple orientations. At least one of the multiple polarization angles or the multiple orientations are identified where the differences in reflectance are indicative of a suppressed influence from the non-ideal structures.
    Type: Application
    Filed: March 11, 2021
    Publication date: September 15, 2022
    Inventors: Eric Chin Hong Ng, Edward Budiarto, Sergey Starik, Todd J. Egan
  • Patent number: 10217213
    Abstract: An embodiment of the invention provides a method for identifying internal trauma in a patient for pneumothorax, hemothorax and abdominal hemorrhage using ultrasound in B-modes with radial, longitudinal, phased array probes, and with M-mode for verification of lung sliding and lung point. Identifications are based on statistical classifications of image features, including A-line, B-line, lung sliding, barcode, sky, seashore, and beach patterns. For blood pools, a polygon is fitted to the boundary, and a cellular automaton extracts local interference patterns due to cavity shape. Logic is then applied to extractions to identify the trauma. With B-mode, feature extraction involves specialized algorithms operating at frame rate for tracking of features such as ribs and rib shadows, pleural line and fast changes in peak intensities along the pleural line. Results are presented on screen by means of highlighting and textual cues.
    Type: Grant
    Filed: September 30, 2014
    Date of Patent: February 26, 2019
    Assignee: The United States of America as represented by The Secretary of the Army
    Inventors: Lorne Blackbourne, Eric Chin, Ronald Grisell, Jose Salinas, Shane Summers
  • Patent number: 9828091
    Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.
    Type: Grant
    Filed: November 5, 2015
    Date of Patent: November 28, 2017
    Assignee: X Development LLC
    Inventors: Damon Vander Lind, Eric Chin, Kurt Hallamasek
  • Publication number: 20160239959
    Abstract: An embodiment of the invention provides a method for identifying internal trauma in a patient for pneumothorax, hemothorax and abdominal hemorrhage using ultrasound in B-modes with radial, longitudinal, phased array probes, and with M-mode for verification of lung sliding and lung point. Identifications are based on statistical classifications of image features, including A-line, B-line, lung sliding, barcode, sky, seashore, and beach patterns. For blood pools, a polygon is fitted to the boundary, and a cellular automaton extracts local interference patterns due to cavity shape. Logic is then applied to extractions to identify the trauma. With B-mode, feature extraction involves specialized algorithms operating at frame rate for tracking of features such as ribs and rib shadows, pleural line and fast changes in peak intensities along the pleural line. Results are presented on screen by means of highlighting and textual cues.
    Type: Application
    Filed: September 30, 2014
    Publication date: August 18, 2016
    Applicant: U.S. Government, as represented by the Secretary of the Army
    Inventors: Lorne Blackbourne, Eric Chin, Ronald Grisell, Jose Salinas, Shane Summers
  • Publication number: 20160052629
    Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.
    Type: Application
    Filed: November 5, 2015
    Publication date: February 25, 2016
    Inventors: Damon Vander Lind, Eric Chin, Kurt Hallamasek
  • Patent number: 9205920
    Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.
    Type: Grant
    Filed: December 30, 2013
    Date of Patent: December 8, 2015
    Assignee: Google Inc.
    Inventors: Damon Vander Lind, Eric Chin, Kurt Hallamasek
  • Publication number: 20150183515
    Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.
    Type: Application
    Filed: December 30, 2013
    Publication date: July 2, 2015
    Applicant: Google Inc.
    Inventors: Damon Vander Lind, Eric Chin, Kurt Hallamasek
  • Patent number: D735077
    Type: Grant
    Filed: November 20, 2013
    Date of Patent: July 28, 2015
    Assignee: HONDA MOTOR CO., LTD.
    Inventors: Yasuhiro Sato, Edward Birtulescu, Daisuke Nagao, Eric Chin, Hiroyuki Miyazaki, Takao Mikami
  • Patent number: D737724
    Type: Grant
    Filed: May 13, 2014
    Date of Patent: September 1, 2015
    Assignee: HONDA MOTOR CO., LTD.
    Inventors: Anthony Schroeder, Eric Chin, Erik Dunshee
  • Patent number: D896702
    Type: Grant
    Filed: June 19, 2018
    Date of Patent: September 22, 2020
    Assignee: HONDA MOTOR CO., LTD.
    Inventors: Erik Dunshee, Asao Itaya, Eric Chin, Takao Mikami
  • Patent number: D896703
    Type: Grant
    Filed: June 19, 2018
    Date of Patent: September 22, 2020
    Assignee: HONDA MOTOR CO., LTD.
    Inventors: Erik Dunshee, Asao Itaya, Eric Chin, Takao Mikami