Patents by Inventor Eric Chin
Eric Chin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20250183071Abstract: Disclosed systems and techniques are directed to interferometry-based temperature monitoring of various operations performed in manufacturing systems. For example, the disclosed techniques include directing an incident light to a sample and detecting a plurality of interference patterns (IPs) associated with a light departing from the sample. The light departing from the sample can be generated upon interaction of the incident light with the sample. Each IP of the plurality of IPs can be associated with a respective temperature of a plurality of temperatures of the sample. The techniques further include determining, using the plurality of IPs, a temperature difference between a first temperature of the plurality of temperatures and a second temperature of the plurality of temperatures.Type: ApplicationFiled: December 2, 2024Publication date: June 5, 2025Inventors: Eric Chin Hong Ng, Mehdi Vaez-Iravani
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Publication number: 20250164238Abstract: A system includes a radiation source configured to emit a radiation beam, a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object, a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object, and a third optical sensor configured to detect a third intensity of a third portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor, the second optical sensor, and the third optical sensor. The processing device is configured to determine a roughness or an emissivity of the surface of the object based on a comparison of two or more of the first intensity, the second intensity, or the third intensity.Type: ApplicationFiled: November 16, 2023Publication date: May 22, 2025Inventors: Eric Chin Hong Ng, Todd Jonathan Egan, Mayu Felicia Yamamura, Phillip William Peters, Christopher Beaudry, Mehdi Vaez-Iravani
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Publication number: 20250125171Abstract: A method includes identifying a first growth rate of a first region of a substrate associated with one or more substrate deposition processes performed in a processing chamber of substrate processing equipment. The method further includes determining, based on the first growth rate, thickness data of a second region of the substrate without second structure data of the second region. The thickness data is determined in a non-destructive manner. The method further includes causing performance of an action associated with processing one or more substrates via the processing chamber of the substrate processing equipment based on the thickness data of the second region of the substrate.Type: ApplicationFiled: December 23, 2024Publication date: April 17, 2025Inventors: Eric Chin Hong Ng, Edward Wibowo Budiarto, Mehdi Vaez-Iravani, Todd Jonathan Egan, Venkatakaushik Voleti
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Patent number: 12211717Abstract: A method includes identifying first structure data of a first region of a substrate and receiving optical metrology data of the substrate associated with one or more substrate deposition processes in a processing chamber. The method further includes determining, based on the optical metrology data and the first structure data, a first growth rate of the first region of the substrate associated with the one or more substrate deposition processes. The method further includes predicting, based on the optical metrology data and the first growth rate, thickness data of a second region of the substrate without second structure data of the second region.Type: GrantFiled: March 29, 2021Date of Patent: January 28, 2025Assignee: Applied Materials, Inc.Inventors: Eric Chin Hong Ng, Edward Wibowo Budiarto, Mehdi Vaez-Iravani, Todd Jonathan Egan, Venkatakaushik Voleti
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Patent number: 12098914Abstract: A system includes a radiation source configured to emit a radiation beam. The system further includes a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object. The system further includes a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor and the second optical sensor. The processing device is configured to determine at least one of a roughness or an emissivity of the surface of the object based on a comparison of the first intensity and the second intensity.Type: GrantFiled: September 29, 2022Date of Patent: September 24, 2024Assignee: Applied Materials, Inc.Inventors: Eric Chin Hong Ng, Todd J. Egan, Mehdi Vaez-Iravani
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Patent number: 12062583Abstract: An optical metrology model for in-line thickness measurements of a film overlying non-ideal structures on a substrate is generated by performing pre-measurements prior to deposition of the film and performing post-measurements after the deposition. The pre- and post-measurements are performed at at least one of multiple polarization angles or multiple orientations of the substrate. Differences in reflectance between the pre- and post-measurements are determined at the multiple polarization angles and the multiple orientations. At least one of the multiple polarization angles or the multiple orientations are identified where the differences in reflectance are indicative of a suppressed influence from the non-ideal structures. The optical metrology model is generated using the identified polarization angles and the identified orientations as inputs to a machine-learning algorithm.Type: GrantFiled: March 11, 2021Date of Patent: August 13, 2024Assignee: Applied Materials Israel Ltd.Inventors: Eric Chin Hong Ng, Edward Budiarto, Sergey Starik, Todd J. Egan
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Publication number: 20240110782Abstract: A system includes a radiation source configured to emit a radiation beam. The system further includes a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object. The system further includes a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor and the second optical sensor. The processing device is configured to determine at least one of a roughness or an emissivity of the surface of the object based on a comparison of the first intensity and the second intensity.Type: ApplicationFiled: September 29, 2022Publication date: April 4, 2024Inventors: Eric Chin Hong Ng, Todd J. Egan, Mehdi Vaez-Iravani
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Publication number: 20230398095Abstract: A method for treating age-related macular degeneration (AMD), either wet AMD or dry AMD. In the method, a therapeutic agent is administered to the patient. The therapeutic agent includes an antioxidant carbazole moiety fused to a nicotine analog. The patient is then monitored to determine the state of the age-related macular degeneration. The therapeutic agent may be administered orally, by injection, or by eye drops in preferred embodiments.Type: ApplicationFiled: June 10, 2022Publication date: December 14, 2023Inventors: Ahmad Alkayali, David Almeida, Eric Chin
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Publication number: 20220310425Abstract: A method includes identifying first structure data of a first region of a substrate and receiving optical metrology data of the substrate associated with one or more substrate deposition processes in a processing chamber. The method further includes determining, based on the optical metrology data and the first structure data, a first growth rate of the first region of the substrate associated with the one or more substrate deposition processes. The method further includes predicting, based on the optical metrology data and the first growth rate, thickness data of a second region of the substrate without second structure data of the second region.Type: ApplicationFiled: March 29, 2021Publication date: September 29, 2022Inventors: Eric Chin Hong Ng, Edward Wibowo Budiarto, Mehdi Vaez-Iravani, Todd Jonathan Egan, Venkatakaushik Voleti
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Publication number: 20220290974Abstract: An optical metrology model for in-line thickness measurements of a film overlying non-ideal structures on a substrate is generated by performing pre-measurements prior to deposition of the film and performing post-measurements after the deposition. The pre- and post-measurements are performed at at least one of multiple polarization angles or multiple orientations of the substrate. Differences in reflectance between the pre- and post-measurements are determined at the multiple polarization angles and the multiple orientations. At least one of the multiple polarization angles or the multiple orientations are identified where the differences in reflectance are indicative of a suppressed influence from the non-ideal structures.Type: ApplicationFiled: March 11, 2021Publication date: September 15, 2022Inventors: Eric Chin Hong Ng, Edward Budiarto, Sergey Starik, Todd J. Egan
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Patent number: 10217213Abstract: An embodiment of the invention provides a method for identifying internal trauma in a patient for pneumothorax, hemothorax and abdominal hemorrhage using ultrasound in B-modes with radial, longitudinal, phased array probes, and with M-mode for verification of lung sliding and lung point. Identifications are based on statistical classifications of image features, including A-line, B-line, lung sliding, barcode, sky, seashore, and beach patterns. For blood pools, a polygon is fitted to the boundary, and a cellular automaton extracts local interference patterns due to cavity shape. Logic is then applied to extractions to identify the trauma. With B-mode, feature extraction involves specialized algorithms operating at frame rate for tracking of features such as ribs and rib shadows, pleural line and fast changes in peak intensities along the pleural line. Results are presented on screen by means of highlighting and textual cues.Type: GrantFiled: September 30, 2014Date of Patent: February 26, 2019Assignee: The United States of America as represented by The Secretary of the ArmyInventors: Lorne Blackbourne, Eric Chin, Ronald Grisell, Jose Salinas, Shane Summers
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Patent number: 9828091Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.Type: GrantFiled: November 5, 2015Date of Patent: November 28, 2017Assignee: X Development LLCInventors: Damon Vander Lind, Eric Chin, Kurt Hallamasek
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Publication number: 20160239959Abstract: An embodiment of the invention provides a method for identifying internal trauma in a patient for pneumothorax, hemothorax and abdominal hemorrhage using ultrasound in B-modes with radial, longitudinal, phased array probes, and with M-mode for verification of lung sliding and lung point. Identifications are based on statistical classifications of image features, including A-line, B-line, lung sliding, barcode, sky, seashore, and beach patterns. For blood pools, a polygon is fitted to the boundary, and a cellular automaton extracts local interference patterns due to cavity shape. Logic is then applied to extractions to identify the trauma. With B-mode, feature extraction involves specialized algorithms operating at frame rate for tracking of features such as ribs and rib shadows, pleural line and fast changes in peak intensities along the pleural line. Results are presented on screen by means of highlighting and textual cues.Type: ApplicationFiled: September 30, 2014Publication date: August 18, 2016Applicant: U.S. Government, as represented by the Secretary of the ArmyInventors: Lorne Blackbourne, Eric Chin, Ronald Grisell, Jose Salinas, Shane Summers
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Publication number: 20160052629Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.Type: ApplicationFiled: November 5, 2015Publication date: February 25, 2016Inventors: Damon Vander Lind, Eric Chin, Kurt Hallamasek
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Patent number: 9205920Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.Type: GrantFiled: December 30, 2013Date of Patent: December 8, 2015Assignee: Google Inc.Inventors: Damon Vander Lind, Eric Chin, Kurt Hallamasek
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Publication number: 20150183515Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.Type: ApplicationFiled: December 30, 2013Publication date: July 2, 2015Applicant: Google Inc.Inventors: Damon Vander Lind, Eric Chin, Kurt Hallamasek
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Patent number: D735077Type: GrantFiled: November 20, 2013Date of Patent: July 28, 2015Assignee: HONDA MOTOR CO., LTD.Inventors: Yasuhiro Sato, Edward Birtulescu, Daisuke Nagao, Eric Chin, Hiroyuki Miyazaki, Takao Mikami
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Patent number: D737724Type: GrantFiled: May 13, 2014Date of Patent: September 1, 2015Assignee: HONDA MOTOR CO., LTD.Inventors: Anthony Schroeder, Eric Chin, Erik Dunshee
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Patent number: D896702Type: GrantFiled: June 19, 2018Date of Patent: September 22, 2020Assignee: HONDA MOTOR CO., LTD.Inventors: Erik Dunshee, Asao Itaya, Eric Chin, Takao Mikami
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Patent number: D896703Type: GrantFiled: June 19, 2018Date of Patent: September 22, 2020Assignee: HONDA MOTOR CO., LTD.Inventors: Erik Dunshee, Asao Itaya, Eric Chin, Takao Mikami