Abstract: Disclosed systems and techniques are directed to interferometry-based temperature monitoring of various operations performed in manufacturing systems. For example, the disclosed techniques include directing an incident light to a sample and detecting a plurality of interference patterns (IPs) associated with a light departing from the sample. The light departing from the sample can be generated upon interaction of the incident light with the sample. Each IP of the plurality of IPs can be associated with a respective temperature of a plurality of temperatures of the sample. The techniques further include determining, using the plurality of IPs, a temperature difference between a first temperature of the plurality of temperatures and a second temperature of the plurality of temperatures.

Abstract: A system includes a radiation source configured to emit a radiation beam, a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object, a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object, and a third optical sensor configured to detect a third intensity of a third portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor, the second optical sensor, and the third optical sensor. The processing device is configured to determine a roughness or an emissivity of the surface of the object based on a comparison of two or more of the first intensity, the second intensity, or the third intensity.

Abstract: A method includes identifying a first growth rate of a first region of a substrate associated with one or more substrate deposition processes performed in a processing chamber of substrate processing equipment. The method further includes determining, based on the first growth rate, thickness data of a second region of the substrate without second structure data of the second region. The thickness data is determined in a non-destructive manner. The method further includes causing performance of an action associated with processing one or more substrates via the processing chamber of the substrate processing equipment based on the thickness data of the second region of the substrate.

Abstract: A method includes identifying first structure data of a first region of a substrate and receiving optical metrology data of the substrate associated with one or more substrate deposition processes in a processing chamber. The method further includes determining, based on the optical metrology data and the first structure data, a first growth rate of the first region of the substrate associated with the one or more substrate deposition processes. The method further includes predicting, based on the optical metrology data and the first growth rate, thickness data of a second region of the substrate without second structure data of the second region.

Abstract: A system includes a radiation source configured to emit a radiation beam. The system further includes a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object. The system further includes a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor and the second optical sensor. The processing device is configured to determine at least one of a roughness or an emissivity of the surface of the object based on a comparison of the first intensity and the second intensity.

Abstract: An optical metrology model for in-line thickness measurements of a film overlying non-ideal structures on a substrate is generated by performing pre-measurements prior to deposition of the film and performing post-measurements after the deposition. The pre- and post-measurements are performed at at least one of multiple polarization angles or multiple orientations of the substrate. Differences in reflectance between the pre- and post-measurements are determined at the multiple polarization angles and the multiple orientations. At least one of the multiple polarization angles or the multiple orientations are identified where the differences in reflectance are indicative of a suppressed influence from the non-ideal structures. The optical metrology model is generated using the identified polarization angles and the identified orientations as inputs to a machine-learning algorithm.

Abstract: A system includes a radiation source configured to emit a radiation beam. The system further includes a first optical sensor configured to detect a first intensity of a first portion of the radiation beam reflected from a surface of an object. The system further includes a second optical sensor configured to detect a second intensity of a second portion of the radiation beam scattered by the surface of the object. The system further includes a processing device communicatively coupled to the first optical sensor and the second optical sensor. The processing device is configured to determine at least one of a roughness or an emissivity of the surface of the object based on a comparison of the first intensity and the second intensity.

Abstract: A method for treating age-related macular degeneration (AMD), either wet AMD or dry AMD. In the method, a therapeutic agent is administered to the patient. The therapeutic agent includes an antioxidant carbazole moiety fused to a nicotine analog. The patient is then monitored to determine the state of the age-related macular degeneration. The therapeutic agent may be administered orally, by injection, or by eye drops in preferred embodiments.

Abstract: A method includes identifying first structure data of a first region of a substrate and receiving optical metrology data of the substrate associated with one or more substrate deposition processes in a processing chamber. The method further includes determining, based on the optical metrology data and the first structure data, a first growth rate of the first region of the substrate associated with the one or more substrate deposition processes. The method further includes predicting, based on the optical metrology data and the first growth rate, thickness data of a second region of the substrate without second structure data of the second region.

Abstract: An optical metrology model for in-line thickness measurements of a film overlying non-ideal structures on a substrate is generated by performing pre-measurements prior to deposition of the film and performing post-measurements after the deposition. The pre- and post-measurements are performed at at least one of multiple polarization angles or multiple orientations of the substrate. Differences in reflectance between the pre- and post-measurements are determined at the multiple polarization angles and the multiple orientations. At least one of the multiple polarization angles or the multiple orientations are identified where the differences in reflectance are indicative of a suppressed influence from the non-ideal structures.

Abstract: An embodiment of the invention provides a method for identifying internal trauma in a patient for pneumothorax, hemothorax and abdominal hemorrhage using ultrasound in B-modes with radial, longitudinal, phased array probes, and with M-mode for verification of lung sliding and lung point. Identifications are based on statistical classifications of image features, including A-line, B-line, lung sliding, barcode, sky, seashore, and beach patterns. For blood pools, a polygon is fitted to the boundary, and a cellular automaton extracts local interference patterns due to cavity shape. Logic is then applied to extractions to identify the trauma. With B-mode, feature extraction involves specialized algorithms operating at frame rate for tracking of features such as ribs and rib shadows, pleural line and fast changes in peak intensities along the pleural line. Results are presented on screen by means of highlighting and textual cues.

Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.

Abstract: An embodiment of the invention provides a method for identifying internal trauma in a patient for pneumothorax, hemothorax and abdominal hemorrhage using ultrasound in B-modes with radial, longitudinal, phased array probes, and with M-mode for verification of lung sliding and lung point. Identifications are based on statistical classifications of image features, including A-line, B-line, lung sliding, barcode, sky, seashore, and beach patterns. For blood pools, a polygon is fitted to the boundary, and a cellular automaton extracts local interference patterns due to cavity shape. Logic is then applied to extractions to identify the trauma. With B-mode, feature extraction involves specialized algorithms operating at frame rate for tracking of features such as ribs and rib shadows, pleural line and fast changes in peak intensities along the pleural line. Results are presented on screen by means of highlighting and textual cues.

Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.

Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.

Abstract: Systems and methods are provided for a wiring harness for an aerial vehicle. A wing of the aerial vehicle comprises a pocket for insertion of the wiring harness. The wiring harness provides wiring and associated connections capable to attach to and power various components.