Patents by Inventor Eric Falzon

Eric Falzon has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110193711
    Abstract: Method for detecting, in a load (2), the presence of objects suspected of containing at least one material having a given atomic weight, in which the load (2) is exposed to at least a first X-ray beam having a first spectrum and an atomic number class to which the materials, including the load through which the X-rays pass, is determined by high-energy discrimination. Furthermore, at least one g-ray or neutron beam spontaneously emitted by the load is measured, a spontaneous g and/or neutron radiation emission class of the material including the load is determined from the spontaneous radiation measurement, and a class of interest of the material of the load is determined from the atomic number class and the spontaneous radiation class that were determined.
    Type: Application
    Filed: July 6, 2009
    Publication date: August 11, 2011
    Applicant: SMITHS HEIMANN SAS
    Inventors: Jean Michel Faugier, Nicolas Dumay, Eric Simon, Eric Falzon, Jean Philippe Denis