Abstract: A processing circuit includes a plurality of circuit blocks connected in series to a high-voltage supply and a voltage equalizer. The plurality of circuit blocks includes a corresponding plurality of voltage supply terminals and a corresponding plurality of ground terminals. Each circuit block of the plurality of circuit blocks includes a voltage supply terminal of the plurality of voltage supply terminals and a ground terminal of the plurality of ground terminals. At least two of the plurality of circuit blocks are serially coupled to each other. The voltage equalizer includes a plurality of equalizer terminals. An equalizer terminal of the plurality of equalizer terminals is coupled to a corresponding voltage supply terminal of the plurality of voltage supply terminals. The voltage supply terminal of at least one circuit block of the plurality of circuit blocks is coupled to a high-voltage source.

Abstract: Examples relate to control apparatus, a control device, a method and a computer program for determining a device-specific supply voltage for a semiconductor device, and to a corresponding semiconductor device and corresponding systems. The control apparatus is configured to obtain measurement data of measurement circuitry of the semiconductor device, the measurement data being related to a progress of aging of the semiconductor device. The control apparatus is configured to determine the device-specific supply voltage of the semiconductor device based on the measurement data. The control apparatus is configured to provide information on the device-specific supply voltage for a supply voltage control apparatus.

Abstract: A processor may include a core and an uncore area. The power consumed by the core area may be controlled by controlling the Cdyn of the processor such that the Cdyn is within an allowable Cdyn value irrespective of the application being processed by the core area. The power management technique includes measuring digital activity factor (DAF), monitoring architectural and data activity levels, and controlling power consumption by throttling the instructions based on the activity levels. As a result of throttling the instructions, throttling may be implemented in 3rd droop and thermal design point (TDP). Also, the idle power consumed by the uncore area while the core area is in deep power saving states may be reduced by varying the reference voltage VR and the VP provided to the uncore area. As a result, the idle power consumed by the uncore area may be reduced.

Abstract: A processor may include a core and an uncore area. The power consumed by the core area may be controlled by controlling the dynamic capacitance of the processor such that the dynamic capacitance is within an allowable dynamic capacitance value irrespective of the application being processed by the core area. The power management technique includes measuring digital activity factor (DAF), monitoring architectural and data activity levels, and controlling power consumption by throttling the instructions based on the activity levels. As a result of throttling the instructions, throttling may be implemented in 3rd droop and thermal design point (TDP). Also, the idle power consumed by the uncore area while the core area is in deep power saving states may be reduced by varying the reference voltage VR and the VP provided to the uncore area. As a result, the idle power consumed by the uncore area may be reduced.

Abstract: A processor may include a core and an uncore area. The power consumed by the core area may be controlled by controlling the Cdyn of the processor such that the Cdyn is within an allowable Cdyn value irrespective of the application being processed by the core area. The power management technique includes measuring digital activity factor (DAF), monitoring architectural and data activity levels, and controlling power consumption by throttling the instructions based on the activity levels. As a result of throttling the instructions, throttling may be implemented in 3rd droop and thermal design point (TDP). Also, the idle power consumed by the uncore area while the core area is in deep power saving states may be reduced by varying the reference voltage VR and the VP provided to the uncore area. As a result, the idle power consumed by the uncore area may be reduced.

Abstract: A processor may include a core and an uncore area. The power consumed by the core area may be controlled by controlling the Cdyn of the processor such that the Cdyn is within an allowable Cdyn value irrespective of the application being processed by the core area. The power management technique includes measuring digital activity factor (DAF), monitoring architectural and data activity levels, and controlling power consumption by throttling the instructions based on the activity levels. As a result of throttling the instructions, throttling may be implemented in 3rd droop and thermal design point (TDP). Also, the idle power consumed by the uncore area while the core area is in deep power saving states may be reduced by varying the reference voltage VR and the VP provided to the uncore area. As a result, the idle power consumed by the uncore area may be reduced.

Abstract: A circuit and method for receiving data signals over a data signal line are disclosed. In one embodiment, a receiver circuit is provided for receiving data signals transmitted over a signal line. The receiver circuit comprises an inverter circuit having an input that forms an input of the receiver circuit and an output coupled to an internal node, an output circuit having an input coupled to the internal node and an output that provides an output of the receiver circuit, and a charge adding circuit that provides at least a portion of a temporary logic transition at the input of the receiver circuit, induced by a logic transition on an adjacent signal line, to the internal node to mitigate erroneous logic transitions associated with the receiver circuit.

Abstract: According to at least one embodiment, a system comprises means for performing an operation utilizing a clock signal. The system further comprises means for supplying a variable operating voltage to the performing means, and means for dynamically varying the frequency of the clock signal responsive to observed changes in the variable operating voltage.

Abstract: According to at least one embodiment, a system comprises means for performing an operation utilizing a clock signal. The system further comprises means for supplying a variable operating voltage to the performing means, and means for dynamically varying the frequency of the clock signal responsive to observed changes in the variable operating voltage.

Abstract: Systems and methods are provided that can be utilized to estimate power associated with a circuit design. The estimated power is determined by employing power characterizations to determine power consumption associated with non-conventional circuits in the circuit design. The power characterizations can be determined prior to circuit design timing analysis, stored and utilized during circuit design timing analysis. The power estimates associated with the non-conventional circuits can be added to power estimates associated with the conventional circuits of the circuit design to compute a power associated with the circuit design.

Abstract: Systems and methods are disclosed for providing a temporarily modified output. A waveform control provides a control output that temporarily adjusts to an intermediate level between normal high and low levels during a first operating mode. The waveform control provides the control output to transition periodically between the high and low levels during a second operating mode. A delay network controls the waveform control to provide the output at the intermediate level for a duration during the first operating mode.

Abstract: The present invention is directed to a system and method for measuring a current in an integrated circuit comprising measuring a first output count from a first voltage controlled oscillator (VCO) using a first measurement voltage, simultaneously measuring a second output count from a second VCO using a second measurement voltage, and calculating the current in the integrated circuit using a voltage proportional to a difference between the first and second output counts.

Abstract: The invention provides a method and circuit for measuring on-chip, cycle-to-cycle, jitter. Copies of a circuit comprising a programmable delay line, a programmable phase comparator, and two counters are placed at different locations on an IC near a clock signal. The programmable delay line creates a clock signal that is delayed by one clock cycle. This delayed clock signal is compared in time to the original clock signal by the programmable phase comparator. If the difference in time between the delayed clock signal and the clock signal is greater than the dead time, the first counter is triggered. If the difference in time is negative and the absolute value is greater than the dead time, the second counter is triggered. A statistical distribution, based on the values of the counters, is created. This distribution is used to predict on-chip, cycle-to-cycle jitter.

Abstract: A method and system for evaluating the speed of a circuit are provided. In accordance with one embodiment, the method comprises determining during a first operational phase of a first operational cycle the propagation speed of a first signal in a first signal propagation path, and concurrently preventing all signals from propagating in a second signal propagation path substantially parallel with the first signal propagation path. The method further comprises determining during a second operational phase alternating with the first operational phase the propagation speed of a second signal in the second signal propagation path, and concurrently preventing all signals from propagating in the first signal propagation path.