Patents by Inventor Eric G. Moore

Eric G. Moore has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of identifying the point at which an integrated circuit fails a functional test
    Patent number: 6014033
    Abstract: A test system (10) is provided that comprises a controller (14) which controls a test head (12) which comprises a pattern sequence controller (16). An integrated circuit (20) is tested through pin cards (18a) through (18n). A test program (32) operating in controller (14) operates to perform both functional and scanning tests on the integrated circuit (20). Scanning tests are provided for set-up, hold, pulse width, and maximum frequency.
    Type: Grant
    Filed: August 28, 1996
    Date of Patent: January 11, 2000
    Assignee: Texas Instruments Incorporated
    Inventors: Glenn R. Fitzgerald, Eric G. Moore, Randy L. Williams