Abstract: A component inspection apparatus includes a component holder mounted on a compound slide structure. Two arrays of gauging elements are provided on a mutually perpendicularly movable slide. These arrays can be adjusted on the slide and each array includes a plurality of separate gauge elements movable by contact with the work and at least one linear transducer connected to each gauge element. In use, the slides are moved to a plurality of predetermined positions in a sequence. The displacements of the probe elements at each position are noted and compared with displacements obtained when the same sequence of positions is followed while a master componet is in the holder.

Abstract: A component measuring machine includes a base on which a carriage is mounted for movement along an x-axis. A compound slide structure is mounted on the carriage for moving a cradle along y- and z-axes. A support on the carriage and the cradle supports an arm so that it is angularly movable about a point relative to the carriage. Thickness measurements can be made by means of a caliper structure mounted on the end of the arm, which can be turned about its own longitudinal axis for varying the orientation of the caliper structure. The precise positions of the contact tips of the caliper structure are determined by accurately monitoring displacements of the carriage and the compound slide structure, and turning of the arm on its axis.