Patents by Inventor Eric John Bennett

Eric John Bennett has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Manipulable aid for dimensional metrology
    Patent number: 8352212
    Abstract: A manipulable aid which is separate and distinct from the probe of a CMM permits a CMM operator to more directly interact with a CMM measurement volume to align a workpiece, configure a measurement path, and/or program a dimensional metrology application.
    Type: Grant
    Filed: November 18, 2009
    Date of Patent: January 8, 2013
    Assignee: Hexagon Metrology, Inc.
    Inventors: William Fetter, Eric John Bennett, Wilhelmus Weekers, Gary W. Russell
  • MANIPULABLE AID FOR DIMENSIONAL METROLOGY
    Publication number: 20110119025
    Abstract: A manipulable aid which is separate and distinct from the probe of a CMM permits a CMM operator to more directly interact with a CMM measurement volume to align a workpiece, configure a measurement path, and/or program a dimensional metrology application.
    Type: Application
    Filed: November 18, 2009
    Publication date: May 19, 2011
    Applicant: Hexagon Metrology, Inc.
    Inventors: WILLIAM FETTER, Eric John Bennett, Wilhelmus Weekers, Gary W. Russell