Patents by Inventor Eric Jon Ojard
Eric Jon Ojard has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20260044934Abstract: The technology disclosed relates to equalizer-based intensity correction for base calling. In particular, the technology disclosed relates to accessing an image whose pixels depict intensity emissions from a target cluster and intensity emissions from additional adjacent clusters, selecting a lookup table that contains pixel coefficients that are configured to increase a signal-to-noise ratio, applying the pixel coefficients to intensity values of the pixels in the image to produce an output, and base calling the target cluster based on the output.Type: ApplicationFiled: October 20, 2025Publication date: February 12, 2026Inventors: Eric Jon OJARD, Rami MEHIO, Gavin Derek PARNABY, Nitin UDPA, John S. VIECELI, Kishore JAGANATHAN, John Randall GOBBEL, Amirali KIA, Anindita DUTTA, Dorna KASHEFHAGHIGHI
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Publication number: 20250371668Abstract: The technology disclosed relates to equalizer-based intensity correction for base calling. In particular, the technology disclosed relates to accessing an image whose pixels depict intensity emissions from a target cluster and intensity emissions from additional adjacent clusters, selecting a lookup table that contains pixel coefficients that are configured to increase a signal-to-noise ratio, applying the pixel coefficients to intensity values of the pixels in the image to produce an output, and base calling the target cluster based on the output.Type: ApplicationFiled: June 11, 2025Publication date: December 4, 2025Inventors: Eric Jon Ojard, Rami Mehio, Gavin Derek Parnaby, Nitin Udpa, John S. Vieceli
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Publication number: 20250307354Abstract: The technology disclosed extracts intensities from sequencing images for base calling target clusters and attenuates spatial crosstalk from neighboring clusters. The technology disclosed accesses a particular section from a plurality of sections of an image output by a sensor, the particular section of the image including at least one pixel depicting intensity emission values from a target cluster and neighboring clusters located across the sensor, and convolves the particular section of the image with a corresponding convolution kernel in a plurality of convolution kernels, to generate a feature map comprising a plurality of feature values. The technology disclosed further assigns a corresponding feature value to the target cluster based on feature values in the plurality of feature values adjoining a center of the target cluster, and processes the corresponding feature value assigned to the target cluster, to base call the target cluster.Type: ApplicationFiled: June 12, 2025Publication date: October 2, 2025Inventors: Abde Ali Hunaid Kagalwalla, Eric Jon Ojard, Rami Mehio, Gavin Derek Parnaby, Nitin Udpa, Bo Lu, John S. Vieceli
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Patent number: 12412387Abstract: The technology disclosed relates to state-based base calling. In particular, the technology disclosed relates to incorporating state information about data from previous sequencing cycles into the analysis of data from a current sequencing cycle when generating a base call for the current sequencing cycle. For example, when generating a base call for an Nth sequencing cycle, the technology disclosed can incorporate into the base calling logic state information about data from sequencing cycles 1 to N?1.Type: GrantFiled: September 14, 2022Date of Patent: September 9, 2025Assignee: Illumina, Inc.Inventors: Gavin Derek Parnaby, Eric Jon Ojard, Dorna Kashefhaghighi
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Publication number: 20250265313Abstract: The technology disclosed corrects inter-cluster intensity profile variation for improved base calling on a cluster-by-cluster basis. The technology disclosed accesses current intensity data and historic intensity data of a target cluster, where the current intensity data is for a current sequencing cycle and the historic intensity data is for one or more preceding sequencing cycles. A first accumulated intensity correction parameter is determined by accumulating distribution intensities measured for the target cluster at the current and preceding sequencing cycles. A second accumulated intensity correction parameter is determined by accumulating intensity errors measured for the target cluster at the current and preceding sequencing cycles. Based on the first and second accumulated intensity correction parameters, next intensity data for a next sequencing cycle is corrected to generate corrected next intensity data, which is used to base call the target cluster at the next sequencing cycle.Type: ApplicationFiled: December 27, 2024Publication date: August 21, 2025Inventors: Eric Jon Ojard, Abde Ali Hunaid Kagalwalla, Rami Mehio, Nitin Udpa, Gavin Derek Parnaby, John S. Vieceli
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Patent number: 12367263Abstract: The technology disclosed extracts intensities from sequencing images for base calling target clusters and attenuates spatial crosstalk from neighboring clusters. The technology disclosed accesses a particular section from a plurality of sections of an image output by a sensor, the particular section of the image including at least one pixel depicting intensity emission values from a target cluster and neighboring clusters located across the sensor, and convolves the particular section of the image with a corresponding convolution kernel in a plurality of convolution kernels, to generate a feature map comprising a plurality of feature values. The technology disclosed further assigns a corresponding feature value to the target cluster based on feature values in the plurality of feature values adjoining a center of the target cluster, and processes the corresponding feature value assigned to the target cluster, to base call the target cluster.Type: GrantFiled: March 13, 2024Date of Patent: July 22, 2025Assignee: Illumina, Inc.Inventors: Abde Ali Hunaid Kagalwalla, Eric Jon Ojard, Rami Mehio, Gavin Derek Parnaby, Nitin Udpa, Bo Lu, John S. Vieceli
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Patent number: 12361525Abstract: The technology disclosed relates to equalizer-based intensity correction for base calling. In particular, the technology disclosed relates to accessing an image whose pixels depict intensity emissions from a target cluster and intensity emissions from additional adjacent clusters, selecting a lookup table that contains pixel coefficients that are configured to increase a signal-to-noise ratio, applying the pixel coefficients to intensity values of the pixels in the image to produce an output, and base calling the target cluster based on the output.Type: GrantFiled: May 8, 2023Date of Patent: July 15, 2025Assignee: Illumina, Inc.Inventors: Eric Jon Ojard, Rami Mehio, Gavin Derek Parnaby, Nitin Udpa, John S. Vieceli
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Publication number: 20250210137Abstract: This disclosure describes methods, non-transitory computer readable media, and systems that generate an improved signal-to-noise-ratio metric for light signals emitted from fluorescent tags of nucleotide bases during a sequence run and use such signal-to-noise-ratio metrics to determine more accurate and flexible base calls. For instance, the disclosed systems can detect a series of signals from labeled nucleotide bases of a nucleotide-sample slide, determine intensity correction parameters based on intensity values for a given sequencing cycle, determine a scaling factor and a noise level based on the intensity correction parameters, and generate a signal-to-noise-ratio metric for the given sequencing cycle based on the scaling factor and the noise level. The disclosed systems can further utilize the signal-to-noise-ratio to generate quality metrics for generated nucleobase calls.Type: ApplicationFiled: December 19, 2024Publication date: June 26, 2025Inventors: Shu Xu, Rami Mehio, Robert Ezra Langlois, Eric Jon Ojard
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Publication number: 20250111898Abstract: This disclosure describes embodiments of methods, systems, and non-transitory computer readable media that can (i) estimate a location error for a predicted location of a cluster of oligonucleotides based on the cluster's signal and (ii) modify the predicted location of the cluster to improve signal detection and base calling on a sequencing device. For example, the disclosed systems can receive a signal from a cluster of oligonucleotides at a predicted location. The disclosed systems can further determine an intensity-value error between an intensity value and an expected intensity value for the signal at the predicted location. Based on the intensity-value error and intensity values from other locations (e.g., other clusters of oligonucleotides) within the region, the disclosed system can determine an estimated location error for the predicted location. The disclosed systems can modify the predicted location of the cluster of oligonucleotides based on the estimated location error.Type: ApplicationFiled: September 27, 2024Publication date: April 3, 2025Inventors: Gavin Derek Parnaby, Eric Jon Ojard, Rami Mehio
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Patent number: 12216741Abstract: The technology disclosed corrects inter-cluster intensity profile variation for improved base calling on a cluster-by-cluster basis. The technology disclosed accesses current intensity data and historic intensity data of a target cluster, where the current intensity data is for a current sequencing cycle and the historic intensity data is for one or more preceding sequencing cycles. A first accumulated intensity correction parameter is determined by accumulating distribution intensities measured for the target cluster at the current and preceding sequencing cycles. A second accumulated intensity correction parameter is determined by accumulating intensity errors measured for the target cluster at the current and preceding sequencing cycles. Based on the first and second accumulated intensity correction parameters, next intensity data for a next sequencing cycle is corrected to generate corrected next intensity data, which is used to base call the target cluster at the next sequencing cycle.Type: GrantFiled: November 3, 2023Date of Patent: February 4, 2025Assignee: Illumina, Inc.Inventors: Eric Jon Ojard, Abde Ali Hunaid Kagalwalla, Rami Mehio, Nitin Udpa, Gavin Derek Parnaby, John S. Vieceli
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Publication number: 20250014680Abstract: Methods, systems, and apparatus, including computer programs for improving the accuracy of a variant call by accounting for indications of correlated error events. In one aspect, a method may include actions of accessing a pileup of sequence reads aligned to a first region of a reference genome, obtaining information describing one or more characteristics of each of the plurality of reads of the pileup, providing one or more inputs to a probability model describing the one or more characteristics of the plurality of reads of the pileup, wherein the probability model is configured to determine a score, for each hypothesis of one or more hypotheses selected based on the one or more inputs, that indicates whether each hypothesis is true, obtaining output information for each of the one or more hypotheses, and determining, based on the obtained output information, a likelihood that a true variant exists at the first position.Type: ApplicationFiled: September 13, 2024Publication date: January 9, 2025Inventor: Eric Jon Ojard
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Publication number: 20240362300Abstract: The technology disclosed extracts intensities from sequencing images for base calling target clusters and attenuates spatial crosstalk from neighboring clusters. The technology disclosed accesses a particular section from a plurality of sections of an image output by a sensor, the particular section of the image including at least one pixel depicting intensity emission values from a target cluster and neighboring clusters located across the sensor, and convolves the particular section of the image with a corresponding convolution kernel in a plurality of convolution kernels, to generate a feature map comprising a plurality of feature values. The technology disclosed further assigns a corresponding feature value to the target cluster based on feature values in the plurality of feature values adjoining a center of the target cluster, and processes the corresponding feature value assigned to the target cluster, to base call the target cluster.Type: ApplicationFiled: March 13, 2024Publication date: October 31, 2024Inventors: Abde Ali Hunaid Kagalwalla, Eric Jon Ojard, Rami Mehio, Gavin Derek Parnaby, Nitin Udpa, Bo Lu, John S. Vieceli
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Publication number: 20240266003Abstract: This disclosure describes embodiments of methods, systems, and non-transitory computer readable media that accurately estimates the crosstalk from an adjacent cluster of oligonucleotides onto a target cluster of oligonucleotides and removes or reduces the crosstalk emitted by the adjacent cluster of oligonucleotides from the target cluster of oligonucleotides. For instance, the disclosed systems can detect the intensity values for a target cluster and the adjacent cluster. Based on the intensity values of the adjacent cluster, the disclosed systems can determine an inter-cluster-interference metric that estimates the crosstalk emitted from the adjacent cluster. The disclosed systems can remove the inter-cluster-interference metric from the intensity value of the target cluster and generate modified intensity values for the target cluster.Type: ApplicationFiled: February 6, 2024Publication date: August 8, 2024Inventors: Gavin Derek Parnaby, Eric Jon Ojard
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Publication number: 20240220584Abstract: The technology disclosed corrects inter-cluster intensity profile variation for improved base calling on a cluster-by-cluster basis. The technology disclosed accesses current intensity data and historic intensity data of a target cluster, where the current intensity data is for a current sequencing cycle and the historic intensity data is for one or more preceding sequencing cycles. A first accumulated intensity correction parameter is determined by accumulating distribution intensities measured for the target cluster at the current and preceding sequencing cycles. A second accumulated intensity correction parameter is determined by accumulating intensity errors measured for the target cluster at the current and preceding sequencing cycles. Based on the first and second accumulated intensity correction parameters, next intensity data for a next sequencing cycle is corrected to generate corrected next intensity data, which is used to base call the target cluster at the next sequencing cycle.Type: ApplicationFiled: November 3, 2023Publication date: July 4, 2024Inventors: Eric Jon OJARD, Abde Ali Hunaid KAGALWALLA, Rami MEHIO, Nitin UDPA, Gavin Derek PARNABY, John S. VIECELI
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Publication number: 20240177807Abstract: The technology disclosed is directed to cluster segmentation and base calling. The technology disclosed describes a computer-implemented method including segmenting a population of clusters into a plurality of subpopulations of clusters based on one or more prior bases called at one or more prior sequencing cycles of a sequencing run. At a current sequencing cycle of the sequencing run, the method includes applying a mixture of four distributions to current sequenced data of each subpopulation of clusters in the plurality of subpopulations of clusters, the four distributions corresponding to four bases adenine (A), cytosine (C), guanine (G), and thymine (T), and the current sequenced data being generated at the current sequencing cycle. The method further includes base calling clusters in a particular subpopulation of clusters using a corresponding mixture of four distributions.Type: ApplicationFiled: September 15, 2023Publication date: May 30, 2024Inventors: John S. Vieceli, Eric Jon Ojard, Aathavan Karunakaran, David Olmstead Bracher, Gery Vessere
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Patent number: 11989265Abstract: The technology disclosed extracts intensities from sequencing images for base calling target clusters and attenuates spatial crosstalk from neighboring clusters. The technology disclosed accesses a particular section from a plurality of sections of an image output by a sensor, the particular section of the image including at least one pixel depicting intensity emission values from a target cluster and neighboring clusters located across the sensor, and convolves the particular section of the image with a corresponding convolution kernel in a plurality of convolution kernels, to generate a feature map comprising a plurality of feature values. The technology disclosed further assigns a corresponding feature value to the target cluster based on feature values in the plurality of feature values adjoining a center of the target cluster, and processes the corresponding feature value assigned to the target cluster, to base call the target cluster.Type: GrantFiled: September 2, 2022Date of Patent: May 21, 2024Assignee: Illumina, Inc.Inventors: Abde Ali Hunaid Kagalwalla, Eric Jon Ojard, Rami Mehio, Gavin Derek Parnaby, Nitin Udpa, Bo Lu, John S. Vieceli
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Patent number: 11853396Abstract: The technology disclosed corrects inter-cluster intensity profile variation for improved base calling on a cluster-by-cluster basis. The technology disclosed accesses current intensity data and historic intensity data of a target cluster, where the current intensity data is for a current sequencing cycle and the historic intensity data is for one or more preceding sequencing cycles. A first accumulated intensity correction parameter is determined by accumulating distribution intensities measured for the target cluster at the current and preceding sequencing cycles. A second accumulated intensity correction parameter is determined by accumulating intensity errors measured for the target cluster at the current and preceding sequencing cycles. Based on the first and second accumulated intensity correction parameters, next intensity data for a next sequencing cycle is corrected to generate corrected next intensity data, which is used to base call the target cluster at the next sequencing cycle.Type: GrantFiled: January 13, 2023Date of Patent: December 26, 2023Assignee: Illumina, Inc.Inventors: Eric Jon Ojard, Abde Ali Hunaid Kagalwalla, Rami Mehio, Nitin Udpa, Gavin Derek Parnaby, John S Vieceli
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Publication number: 20230385991Abstract: The technology disclosed relates to equalizer-based intensity correction for base calling. In particular, the technology disclosed relates to accessing an image whose pixels depict intensity emissions from a target cluster and intensity emissions from additional adjacent clusters, selecting a lookup table that contains pixel coefficients that are configured to increase a signal-to-noise ratio, applying the pixel coefficients to intensity values of the pixels in the image to produce an output, and base calling the target cluster based on the output.Type: ApplicationFiled: May 8, 2023Publication date: November 30, 2023Inventors: Eric Jon OJARD, Rami MEHIO, Gavin Derek PARNABY, Nitin UDPA, John S. VIECELI
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Publication number: 20230343415Abstract: This disclosures describes embodiments of methods, systems, and non-transitory computer readable media that accurately and efficiently estimate the effects of phasing and pre-phasing for a particular cluster of oligonucleotides and determining a cluster-specific-phasing correction for the cluster. For instance, the disclosed systems can dynamically identify clusters of oligonucleotides exhibiting error-inducing sequences that frequently cause phasing or pre-phasing. When the disclosed systems detect signals during cycles at read positions following such an error-inducing sequence, the disclosed systems can generate cluster-specific-phasing coefficients and correct the signals according to such cluster-specific-phasing coefficients. For instance, the disclosed system can utilize a linear equalizer, decision feedback equalizer, or a maximum likelihood sequence estimator to generate cluster-specific-phasing coefficients.Type: ApplicationFiled: November 28, 2022Publication date: October 26, 2023Inventors: Eric Jon Ojard, John S. Vieceli, Gavin Derek Parnaby, Bo Lu, Rami Mehio
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Publication number: 20230298339Abstract: The technology disclosed relates to state-based base calling. In particular, the technology disclosed relates to incorporating state information about data from previous sequencing cycles into the analysis of data from a current sequencing cycle when generating a base call for the current sequencing cycle. For example, when generating a base call for an Nth sequencing cycle, the technology disclosed can incorporate into the base calling logic state information about data from sequencing cycles 1 to N?1.Type: ApplicationFiled: September 14, 2022Publication date: September 21, 2023Applicants: Illumina, Inc., Illumina Software, Inc.Inventors: Gavin Derek PARNABY, Eric Jon OJARD, Dorna KASHEFHAGHIGHI